-
Advanced Microscopy Inc. v. Leica Microsystems Inc. DC
- 1:15-cv-00517
- D. Del.
- Judge: Leonard P. Stark
+1
- Filed: 06/19/2015
- Closed: 11/16/2015
- Latest Docket Entry: 11/16/2015
- Docket updated daily
1
Plaintiff
1
Defendant
5
Accused
Products
1
Patent-in-Suit
151
Days in
Litigation
-
Advanced Microscopy Inc. v. Leica Microsystems Inc. DC
- 1:15-cv-00517
- D. Del.
- Judge: Leonard P. Stark
+1
- Filed: 06/19/2015
- Closed: 11/16/2015
- Latest Docket Entry: 11/16/2015
- Docket updated daily
Causes of Action
Infringement
Willful Patent Infringement
Market Sector
Medical
Court
District of Delaware
Referred Judge
Christopher J. Burke
Assigned Judge
Leonard P. Stark
- Patent Information
