Method for calibrating a resistive contact sensor
First Claim
1. A method of calibration of a contact sensor apparatus comprising an array of discrete and spaced apart sensing elements connected to a resistive element with a location or size of a contact being detectable by measurement of one or more electrical parameter(s) relating to impedance steps along the resistive element, the method comprising:
- applying one or more calibration contact(s) at a plurality of locations across the sensing elements to be calibrated;
monitoring changes in at least one electrical parameter of the one or more electrical parameter(s) during a time that the one or more calibration contact(s) are applied, wherein the at least one electrical parameter is related to a resistance of the resistive element along its length as the one or more calibration contact(s) short different impedance steps thereof;
recording information relating to variation in the at least one electrical parameter, the recorded information allowing assessment of variation in each impedance step along the resistive element; and
wherein at least one of the location and the size of the contact is corrected based on the recorded information relating to the variation in the at least one electrical parameter.
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Accused Products
Abstract
A method of operating a contact sensor and a method of calibration of a contact sensor. The contact sensor comprises an array of discrete and spaced apart sensing elements (102, 202) connected to a resistive element (101, 201) with the location or size of a contact being detectable by measurement of one or more electrical parameter(s) relating to impedance steps along the resistive element (101, 201) is described. The method of operating involves determining a length of the sensing element between the contact and the resistive element and using this to compensate for a parasitic resistance present in the measured resistance of the resistive element. The method of calibration comprises applying one or more calibration contact(s) at a plurality of locations across the sensing elements (102, 202) to be calibrated; monitoring changes in at least one electrical parameter during the time that the calibration contact(s) are applied; and recording information relating to variation in the at least one electrical parameter, the information allowing assessment of the variation in each impedance step across the measured sensing elements. This enables the later use of the sensor to take into account any variation in the impedance steps.
26 Citations
19 Claims
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1. A method of calibration of a contact sensor apparatus comprising an array of discrete and spaced apart sensing elements connected to a resistive element with a location or size of a contact being detectable by measurement of one or more electrical parameter(s) relating to impedance steps along the resistive element, the method comprising:
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applying one or more calibration contact(s) at a plurality of locations across the sensing elements to be calibrated; monitoring changes in at least one electrical parameter of the one or more electrical parameter(s) during a time that the one or more calibration contact(s) are applied, wherein the at least one electrical parameter is related to a resistance of the resistive element along its length as the one or more calibration contact(s) short different impedance steps thereof; recording information relating to variation in the at least one electrical parameter, the recorded information allowing assessment of variation in each impedance step along the resistive element; and wherein at least one of the location and the size of the contact is corrected based on the recorded information relating to the variation in the at least one electrical parameter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A contact sensor apparatus comprising an array of discrete and spaced apart sensing elements connected to a resistive element with a location or size of a contact being detectable by measurement of one or more electrical parameter(s) relating to impedance steps along the resistive element;
- and a processor;
wherein the processor is arranged to, in response to one or more calibration contact(s) applied at a plurality of locations across the sensing elements to be calibrated, monitor changes in at least one electrical parameter of the one or more electrical parameter(s) during a time that the one or more calibration contact(s) are applied, wherein the at least one electrical parameter is related to a resistance of the resistive element along its length as the one or more calibration contact(s) short different impedance steps thereof; and
record information relating to variation in the at least one electrical parameter, the recorded information allowing assessment of variation in each impedance step along the resistive element;
wherein at least one of the location and the size of the contact is corrected based on the recorded information relating to the variation in the at least one electrical parameter. - View Dependent Claims (19)
- and a processor;
Specification