Semiconductor device
First Claim
1. A method of manufacturing a semiconductor device comprising:
- forming a gate electrode over a substrate;
forming a gate insulating layer over the gate electrode;
forming an oxide semiconductor layer over the gate insulating layer by sputtering in a chamber, wherein the oxide semiconductor layer is non-single-crystal;
performing a preheat treatment at 200 to 600°
C. to remove moisture or hydrogen remaining on an inner wall of the chamber before forming the oxide semiconductor layer;
cooling an oxide semiconductor target using non water based coolant; and
removing moisture from an inside of the chamber by using a cryopump at least during the forming of the oxide semiconductor layer,wherein the substrate is heated during forming the oxide semiconductor layer.
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Accused Products
Abstract
An object is, in a thin film transistor including an oxide semiconductor layer, to reduce contact resistance between the oxide semiconductor layer and source and drain electrode layers electrically connected to the oxide semiconductor layer. The source and drain electrode layers have a stacked-layer structure of two or more layers in which a layer in contact with the oxide semiconductor layer is formed using a metal whose work function is lower than the work function of the oxide semiconductor layer or an alloy containing such a metal. Layers other than the layer in contact with the oxide semiconductor layer of the source and drain electrode layers are formed using an element selected from Al, Cr, Cu, Ta, Ti, Mo, or W, an alloy containing any of these elements as a component, an alloy containing any of these elements in combination, or the like.
192 Citations
20 Claims
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1. A method of manufacturing a semiconductor device comprising:
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forming a gate electrode over a substrate; forming a gate insulating layer over the gate electrode; forming an oxide semiconductor layer over the gate insulating layer by sputtering in a chamber, wherein the oxide semiconductor layer is non-single-crystal; performing a preheat treatment at 200 to 600°
C. to remove moisture or hydrogen remaining on an inner wall of the chamber before forming the oxide semiconductor layer;cooling an oxide semiconductor target using non water based coolant; and removing moisture from an inside of the chamber by using a cryopump at least during the forming of the oxide semiconductor layer, wherein the substrate is heated during forming the oxide semiconductor layer. - View Dependent Claims (2, 3, 4, 5)
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6. A method of manufacturing a semiconductor device comprising:
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forming a gate electrode over a substrate; forming a gate insulating layer over the gate electrode; forming an oxide semiconductor layer over the gate insulating layer by sputtering in a chamber, wherein the oxide semiconductor layer is non-single-crystal; performing a preheat treatment at 200 to 600°
C. to remove moisture or hydrogen remaining on an inner wall of the chamber before forming the oxide semiconductor layer;cooling an oxide semiconductor target using non water based coolant; removing moisture from an inside of the chamber by using a cryopump at least during forming the oxide semiconductor layer; processing the oxide semiconductor layer into an island-shaped oxide semiconductor layer which includes a region to become a channel formation region; and heating the island-shaped oxide semiconductor layer at a temperature of 350°
C. to 750°
C. - View Dependent Claims (7, 8, 9, 10, 11, 12)
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13. A method of manufacturing a semiconductor device comprising:
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forming a gate electrode over a substrate; forming a gate insulating layer over the gate electrode; forming an oxide semiconductor layer over the gate insulating layer by sputtering in a chamber, wherein the oxide semiconductor layer is non-single-crystal; performing a preheat treatment at 200 to 600°
C. to remove moisture or hydrogen remaining on an inner wall of the chamber before forming the oxide semiconductor layer;removing moisture from an inside of the chamber by using a cryopump at least during forming the oxide semiconductor layer; processing the oxide semiconductor layer into an island-shaped oxide semiconductor layer which includes a region to become a channel formation region; performing a first heat treatment at a temperature of 350°
C. to 750°
C. after forming the island-shaped oxide semiconductor layer;forming an insulating layer over the oxide semiconductor layer after performing the first heat treatment; and performing a second heat treatment at a temperature of 100°
C. to 400°
C. after forming the insulating layer. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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Specification