Circuits and methods providing calibration for temperature mitigation in a computing device
First Claim
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1. A method comprising:
- generating temperature information from a plurality of temperature sensors within a computing device;
storing a plurality of voltage reduction step values, each voltage reduction step value being associated with a frequency reduction step value and a temperature information rate of change value; and
processing the temperature information to generate voltage reduction steps based on an observed rate of change of the temperature information, wherein processing the temperature information comprises;
matching the observed rate of change of the temperature information to a particular stored temperature information rate of change value;
selecting a stored first voltage reduction step value corresponding to the particular stored temperature information rate of change value; and
reducing an operating voltage of the computing device by the stored first voltage reduction step value.
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Abstract
A method includes generating temperature information from a plurality of temperature sensors within a computing device; and processing the temperature information to generate voltage reduction steps based on an observed rate of change of the temperature information.
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Citations
26 Claims
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1. A method comprising:
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generating temperature information from a plurality of temperature sensors within a computing device; storing a plurality of voltage reduction step values, each voltage reduction step value being associated with a frequency reduction step value and a temperature information rate of change value; and processing the temperature information to generate voltage reduction steps based on an observed rate of change of the temperature information, wherein processing the temperature information comprises; matching the observed rate of change of the temperature information to a particular stored temperature information rate of change value; selecting a stored first voltage reduction step value corresponding to the particular stored temperature information rate of change value; and reducing an operating voltage of the computing device by the stored first voltage reduction step value. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A system comprising:
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a computer processor configured to execute computer-readable instructions, the computer processor being installed in a computing device; and a plurality of temperature sensors disposed within the computing device, the plurality of temperature sensors configured to communicate with the computer processor, the computer processor configured to perform the following operation; gathering temperature data from the plurality of temperature sensors internal to a housing of the computing device during a first period of time; measuring a temperature ramp rate of the computing device from the temperature data; using the temperature ramp rate as a key to select a value from a data structure, wherein the value includes a voltage step size; and reducing an operating voltage of the computing device by the voltage step size. - View Dependent Claims (13, 14, 15, 16)
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17. A computing device comprising:
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means for sensing temperature at a plurality of locations within an external housing of the computing device; means for calculating a junction temperature ramp rate from temperature data from the temperature sensing means; means for parsing a look-up table to select a voltage reduction step size value based on the junction temperature ramp rate; and means for reducing an operating voltage by the voltage reduction step size value. - View Dependent Claims (18, 19, 20, 21)
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22. A method comprising:
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gathering temperature data from a plurality of temperature sensors internal to a housing of a computing device during a first period of time; measuring a temperature ramp rate of the computing device from the temperature data; using the temperature ramp rate as a key to select a value from a data structure, wherein the value includes a voltage step size; and reducing an operating voltage of the computing device by the voltage step size. - View Dependent Claims (23, 24, 25, 26)
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Specification