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Liquid crystal display device

  • US 10,008,608 B2
  • Filed: 05/09/2013
  • Issued: 06/26/2018
  • Est. Priority Date: 11/28/2008
  • Status: Active Grant
First Claim
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1. A display device comprising:

  • a thin film transistor comprising;

    a gate electrode layer;

    a first insulating layer over the gate electrode layer;

    a channel formation region containing an oxide semiconductor, the channel formation region being over the first insulating layer and overlapping with the gate electrode layer;

    an n-type region including one of a source region and a drain region; and

    a second insulating layer over the channel formation region;

    a pixel electrode layer electrically connected to the thin film transistor;

    a light-transmitting chromatic color resin layer between the thin film transistor and the pixel electrode layer;

    a display layer over the thin film transistor, the pixel electrode layer, and the light-transmitting chromatic color resin layer; and

    an electrode layer over the second insulating layer and overlapping with the gate electrode layer and the channel formation region,wherein the channel formation region is included in a semiconductor layer,wherein the n-type region includes crystals each having a diameter of 1 nm to 10 nm,wherein the light-transmitting chromatic color resin layer has a light transmittance lower than the semiconductor layer,wherein the light-transmitting chromatic color resin layer covers the channel formation region and the n-type region,wherein the gate electrode layer contains copper,wherein the first insulating layer is a stacked layer including a first layer and a second layer,wherein the first layer is a different layer from the second layer,wherein the first layer contains silicon and nitrogen,wherein the second layer contains silicon and oxygen,wherein the oxide semiconductor contains indium, gallium, and zinc,wherein the n-type region contains indium, gallium, zinc and oxygen,wherein the second insulating layer contains silicon and oxygen, andwherein a length of the gate electrode layer is larger than a length of the semiconductor layer in a direction parallel to a channel length direction of the thin film transistor.

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