Magnetic low-pass filter

• US 10,012,704 B2
• Filed: 01/21/2016
• Issued: 07/03/2018
• Est. Priority Date: 11/04/2015
• Status: Expired due to Fees

• Current Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Original Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Inventors: Coar, David Nelson
• Primary Examiner(s): NGUYEN, VINH P
• Application Number:
  US15/003,176
• Publication Number:
  US 20170123015A1
• Time in Patent Office: 894 Days
• CPC Class Codes: G01R 33/0017 Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
• CPC Class Codes: G01R 33/02 Measuring direction or magnitude of magnetic fields or magnetic flux G01R33/20 takes precedence

Abstract

Methods and configurations are disclosed for providing band-pass magnetic filtering of signals in magnetic communications and anomaly detection using diamond nitrogen-vacancy (DNV).

Claims

1. A diamond nitrogen-vacancy (DNV) sensor comprising:

a diamond having one or more nitrogen vacancies;

a loop of conductive material positioned adjacent to a portion of the diamond; and

a resistor coupled to a first end of the loop and a second end of the loop, the loop and resistor forming a low pass filter for the DNV sensor.

2. The DNV sensor of claim 1, wherein the loop comprises a plurality of loops.

3. The DNV sensor of claim 1, wherein the resistor is a variable resistor.

4. The DNV sensor of claim 1, wherein the resistor is a potentiometer.

5. The DNV sensor of claim 4, wherein a modification to the potentiometer selectively attenuates a set of high frequency magnetic signals.

6. A system comprising:

a vacancy sensor including;

a vacancy material having a vacancy,

a loop of conductive material positioned adjacent to a portion of the vacancy material, and

a variable resistor coupled to a first end of the loop and a second end of the loop, the loop and variable resistor forming a low pass filter for the vacancy sensor; and

a controller configured to modify the variable resistor.

7. The system of claim 6, wherein the controller modifies the variable resistor to selectively attenuate the low pass filter.

8. The system of claim 6, wherein the controller modifies the variable resistor to selectively attenuate the low pass filter based on an orientation of a detected magnetic signal.

9. A system comprising:

a vacancy sensor including;

a vacancy material having a vacancy,

a loop of conductive material positioned adjacent to a portion of the vacancy material, and

a variable resistor coupled to a first end of the loop and a second end of the loop, the loop and variable resistor forming a low pass filter for the vacancy sensor; and

a controller configured to modify an orientation of the vacancy sensor.

10. The system of claim 9, wherein the controller modifies the orientation of the vacancy sensor, wherein the vacancy sensor is a diamond nitrogen vacancy sensor, based on an orientation of a detected magnetic signal.