Methods and apparatus for detecting and localizing partial conductor failures of implantable device leads

• US 10,039,919 B2
• Filed: 03/25/2014
• Issued: 08/07/2018
• Est. Priority Date: 04/30/2013
• Status: Active Grant

• Current Assignee: Lambda Nu Technology LLC
• Original Assignee: Lambda Nu Technology LLC
• Inventors: Kroll, Mark W., Swerdlow, Charles D.
• Primary Examiner(s): MAHMOOD, NADIA AHMAD
• Application Number:
  US14/224,281
• Publication Number:
  US 20140324123A1
• Time in Patent Office: 1,596 Days
• Field of Search: 607 59, 607 3, 607 5, 607 27
• CPC Class Codes: A61B 2560/0276 Determining malfunction
• CPC Class Codes: A61B 5/276 Protection against electrode failure
• CPC Class Codes: A61B 5/29 for permanent or long-term implantation
• CPC Class Codes: A61N 1/0563 specially adapted for defibrillation or cardioversion

Abstract

Method and apparatus for diagnosis of conductor anomalies, such as partial conductor failures, in an implantable lead for an implantable medical device are disclosed. In various embodiments, small changes in the lead impedance are identified by the use of a small circuit element that is incorporated as part of the distal end of the implantable lead. In various embodiments, the small circuit element is electrically connected to a lead conductor and/or electrode of the implantable lead. Methods of diagnosing conductor anomalies in accordance with these embodiments generate measured values that depend only on the impedance of the conductors and electrodes of the lead, and not on the behavior of the conductor-tissue interface and other body tissues.

Claims

1. An implantable medical system comprising:

an implantable lead that includes a small circuit element positioned within a distal end of the lead and continuously electrically connected between a ring conductor of the lead and one of a tip conductor or a stimulation electrode; and

an implantable electromedical device to which the implantable lead is adapted to be connected, the device including a control system programmed to cause;

a therapeutic pulse to be selectively delivered to the stimulation electrode, and

a DC pulse to be periodically delivered to the lead through the small circuit element to test for a partial conductor failure of the lead by automatically calculating a resistance for the DC pulse through the small circuit element and providing an indication of a partial conductor failure based upon the resistance for the DC pulse through the small circuit element;

wherein the small circuit element remains electrically connected between the ring conductor of the lead and one of the tip conductor or the stimulation electrode when the therapeutic pulse is being delivered.

2. The system of claim 1 where the device causes the DC pulse to be delivered as a moderate frequency signal to the lead.

3. The system of claim 1 wherein the small circuit element is a passive circuit selected from the set consisting of a diode, a capacitor, a diode, and a LC tank circuit.

4. The system of claim 1 wherein the small circuit element is an active circuit including a diode and capacitor circuit controlled by a digital circuit, and wherein device causes a trigger signal to be delivered to the lead to activate the active circuit element for a short period of time during which the DC pulse is caused to be delivered.

5. The system of claim 1 wherein the small circuit element is positioned in the distalmost 10 cm of the lead.

6. The system of claim 1 wherein the small circuit element is a capacitor between the ring conductor and the tip conductor.

7. The system of claim 1 wherein the small circuit element is a capacitor is between the ring conductor and the stimulation electrode conductor.

8. The system of claim 1 wherein the small circuit element is a diode between the ring conductor and the tip conductor.

9. The system of claim 1 wherein the small circuit element is a diode between the ring conductor and the electrode conductor.

10. A medical system comprising:

an implantable lead that is adapted to be implanted in a patient and includes a small circuit element positioned within a distal end of the lead and continuously electrically connected between a ring conductor of the lead and one of a tip conductor or a stimulation electrode; and

an external test device to which the implantable lead is adapted to be connected, the test device including a control system programmed to cause;

a therapeutic pulse to be selectively delivered to the stimulation electrode, and

a DC pulse to be periodically delivered to the lead through the small circuit element to test for a partial conductor failure of the lead by automatically calculating a resistance for the DC pulse through the small circuit element and providing an indication of a partial conductor failure based upon the resistance for the DC pulse through the small circuit element;

wherein the small circuit element remains electrically connected between the ring conductor of the lead and one of the tip conductor or the stimulation electrode when the therapeutic pulse is being delivered.

11. The system of claim 10 where the device causes the DC pulse to be delivered as a moderate frequency signal to the lead.

12. The system of claim 10 wherein the small circuit element is a passive circuit selected from the set consisting of a diode, a capacitor, a diode, and a LC tank circuit.

13. The system of claim 10 wherein the small circuit element is an active circuit including a diode and capacitor circuit controlled by a digital circuit, and wherein device causes a trigger signal to be delivered to the lead to activate the active circuit element for a short period of time during which the DC pulse is caused to be delivered.