Methods and apparatus for processing chamber cleaning end point detection
First Claim
1. An apparatus for detecting a cleaning endpoint of a cleaning process performed within a processing chamber, the apparatus comprising:
- a spectrometer adapted to measure a spectrum response over time of a cleaning reaction within a processing chamber during a cleaning process; and
a zoom lens system coupled to the spectrometer and disposed to focus on a selected area within the processing chamber via a viewport and to amplify intensity of radiation from a cleaning reaction in the selected area during the cleaning process,wherein the selected area is chosen based on being an expected location of a last cleaning reaction during the cleaning process within the processing chamber.
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Abstract
Embodiments provide systems, methods and apparatus for detecting a cleaning endpoint of a cleaning process performed within a processing chamber. Embodiments include a spectrometer adapted to measure a spectrum response over time of a cleaning reaction within a processing chamber during a cleaning process; and a lens system coupled to the spectrometer and disposed to focus on a selected area within the processing chamber via a viewport and to amplify intensity of radiation from the selected area during the cleaning process. The selected area is chosen based on being the expected location of the last cleaning reaction during the cleaning process within the processing chamber (e.g., a corner in a rectangular chamber). Numerous other aspects are provided.
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Citations
20 Claims
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1. An apparatus for detecting a cleaning endpoint of a cleaning process performed within a processing chamber, the apparatus comprising:
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a spectrometer adapted to measure a spectrum response over time of a cleaning reaction within a processing chamber during a cleaning process; and a zoom lens system coupled to the spectrometer and disposed to focus on a selected area within the processing chamber via a viewport and to amplify intensity of radiation from a cleaning reaction in the selected area during the cleaning process, wherein the selected area is chosen based on being an expected location of a last cleaning reaction during the cleaning process within the processing chamber. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of detecting a cleaning endpoint of a cleaning process performed within a processing chamber, the method comprising:
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performing a cleaning process within a processing chamber; focusing a zoom lens system on a selected area within the processing chamber via a viewport during the cleaning process; amplifying an intensity of radiation from a cleaning reaction in the selected area during the cleaning process; and measuring a spectrum response over time of the cleaning reaction within the processing chamber during the cleaning process using a spectrometer coupled to the lens system, wherein the selected area is chosen based on being an expected location of a last cleaning reaction during the cleaning process within the processing chamber. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A system for processing substrates, the system comprising:
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a processing chamber operative to process substrates; and a cleaning endpoint detection apparatus including a spectrometer adapted to measure a spectrum response over time of a cleaning reaction within the processing chamber during a cleaning process and a zoom lens system coupled to the spectrometer and disposed to focus on a selected area within the processing chamber via a viewport and to amplify intensity of radiation from a cleaning reaction in the selected area during the cleaning process, wherein the selected area is chosen based on being an expected location of a last cleaning reaction during the cleaning process within the processing chamber. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification