Optical probe and optical coherence tomography apparatus including the same

• US 10,048,055 B2
• Filed: 01/09/2013
• Issued: 08/14/2018
• Est. Priority Date: 01/09/2012
• Status: Expired due to Fees

• Current Assignee: Korea University Research and Business Foundation, Samsung Electronics Co. Ltd. (Samsung Group)
• Original Assignee: Korea University Research and Business Foundation, Samsung Electronics Co. Ltd. (Samsung Group)
• Inventors: Lim, Jae-guyn, Choi, Hyun, Choi, Min-seog, Choe, Won-he, Lee, Seong-deok, Jang, Woo-young, Kim, Beop-min, Jeong, Hyun-woo
• Primary Examiner(s): Chowdhury, Tarifur
• Assistant Examiner(s): NIXON, OMAR H
• Application Number:
  US13/737,370
• Publication Number:
  US 20130176572A1
• Time in Patent Office: 2,043 Days
• Field of Search: 356479
• CPC Class Codes: A61B 5/0066 Optical coherence imaging
• CPC Class Codes: G01B 2290/65 Spatial scanning object beam
• CPC Class Codes: G01B 9/02 Interferometers
• CPC Class Codes: G01B 9/0201 using temporal phase variation
• CPC Class Codes: G01B 9/02058 by particular optical compensation or alignment elements, e.g. dispersion compensation
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G02B 2207/117 Adjustment of the optical path length
• CPC Class Codes: G02B 26/06 for controlling the phase of light G02B26/08 takes precedence , measuring optical phase difference G01J9/00
• CPC Class Codes: G02B 26/103 having movable or deformable optical fibres, light guides or waveguides as scanning elements light guides per se G02B6/00
• CPC Class Codes: G02B 26/105 with one or more pivoting mirrors or galvano-mirrors G02B26/101 takes precedence

Abstract

An optical probe for irradiating light onto a subject includes an optical path control unit configured to receive light from outside the optical probe, and change a path of the light within the optical probe; an optical path length control element configured to receive the light having the changed path from the optical path control unit, and change an optical path length of the light as the optical path control unit changes the path of the light; and an optical output unit configured to receive the light having the changed optical path length from the optical path length control element, and output the light.

Claims

1. An optical probe for irradiating light onto a subject, the optical probe comprising:

an optical path control unit configured to receive light from outside the optical probe, and to change a path of the light within the optical probe by repeatedly moving a direction in which the light is irradiated onto the subject by a constant lateral distance;

an optical path length control element configured to receive the light having the changed path from the optical path control unit, and to increase an optical path length of the light having the changed path by a constant value each time the direction in which the light is irradiated onto the subject moves by the constant lateral distance by changing a diameter of the light having the changed path by blocking a portion of the light having the changed path according to a direction of the changed path; and

a lens configured to receive the light having the changed optical path length from the optical path length control element, and to irradiate the received light onto the subject,

wherein the optical path control unit comprises a mirror configured to rotate by a degree of rotation about a fixed axis of rotation each time the optical path control unit changes the path of the light,

wherein a cross-section of the optical path control element has a wedge shape.

2. The optical probe of claim 1, wherein the optical path length control element is further configured to transmit the light having the changed path through the optical path length control element, and change the optical path length of the light according to a point of the optical path length control element through which the light passes.

3. The optical probe of claim 2, wherein the optical path length control element has a nonuniform thickness, and comprises a material having a uniform refractive index.

4. The optical probe of claim 3, wherein at least one surface of the optical path length control element has a meniscus shape.

5. The optical probe of claim 2, wherein the optical path length control element comprises at least two materials having different refractive indexes.

6. The optical probe of claim 2, wherein the optical path length control element comprises protrusions on a surface of the optical path length control element.

7. An optical coherence tomography (OCT) apparatus for scanning a subject by irradiating light onto the subject, the apparatus comprising:

a light source configured to generate light;

a light coupler configured to split the generated light into a measurement light and a reference light, transmit the measurement light to an optical probe, and receive a response light from the optical probe, the response light being produced by the measurement light reflecting from the subject;

a sensor configured to detect an interference signal generated by interference between the response signal and the reference signal; and

an image signal processor configured to generate a tomographic image of the subject from the detected interference signal;

wherein the light coupler comprises a beam splitter and a reference mirror,

wherein the optical probe comprises

an optical path control unit configured to receive the measurement light from the light coupler, and to change a path of the measurement light within the optical probe by repeatedly moving a direction in which the measurement light is irradiated onto the subject by a constant lateral distance,

an optical path length control element configured to receive the measurement light having the changed path from the optical path control unit, and to increase an optical path length of the measurement light having the changed path by a constant value each time the direction in which the measurement light is irradiated onto the subject moves by the constant lateral distance by changing a diameter of the measurement light having the changed path by blocking a portion of the measurement light having the changed path according to a direction of the changed path, and

a lens configured to receive the measurement light having the changed optical path length from the optical path length control element, and to irradiate the measurement light output from the optical output unit onto the subject,

wherein the optical path control unit comprises a mirror configured to rotate by a degree of rotation about a fixed axis of rotation each time the optical path control unit chances the path of the light,

wherein a cross-section of the optical path control element has a wedge shape.

8. The apparatus of claim 7, wherein the optical path length control element is further configured to transmit the measurement light having the changed path through the optical path length control element, and change the optical path length of the measurement light according to a point of the optical path length control element through which the measurement light passes.

9. The apparatus of claim 8, wherein the optical path length control element has a nonuniform thickness, and comprises a material having a uniform refractive index.

10. The apparatus of claim 9, wherein at least one surface of the optical path length control element has a meniscus shape.

11. The apparatus of claim 8, wherein the optical path length control element comprises at least two materials having different refractive indexes.

12. The apparatus of claim 8, wherein the optical path length control element comprises protrusions on a surface of the optical path length control element.

13. An optical probe comprising:

an optical path control unit configured to receive light, and to change a path of the light by repeatedly moving a direction in which the light is irradiated onto a subject by a constant lateral distance; and

a scan lens having no moving parts and being configured to receive the light having the controlled path from the optical path control unit, and to modulate an optical path length of the light having the controlled path by increasing the optical path length of the light having the controlled path by a constant value each time the direction in which the light is irradiated onto the subject moves by the constant lateral distance by changing a diameter of the light having the controlled path by blocking a portion of the light having the controlled path according to a direction of the controlled path,

wherein the optical path control unit comprises a mirror configured to rotate by a degree of rotation about a fixed axis of rotation each time the optical path control unit changes the path of the light.

14. The optical probe of claim 13, wherein the scan lens is a passive optical path length modulator configured to modulate the optical path length of the light having the controlled path without any external control as the optical path control unit controls the path of the light.

15. The optical probe of claim 13, wherein the scan lens is further configured to modulate the optical path length of the light having the controlled path according to a characteristic of the optical path length modulator depending on a point where the light having the controlled path is incident on the optical path length modulator.

16. The optical probe of claim 15, wherein the characteristic of the scan lens is an optical path length of the scan lens.