System and method for detection of materials using orbital angular momentum signatures
First Claim
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1. An apparatus for identifying a material within a sample, comprising:
- signal generation circuitry for generating a first signal including a first orbital angular momentum (OAM) signature and applying the first signal to the sample; and
a detector for receiving the first signal after the first signal passes through the sample and identifying the material within the sample based on a detected second orbital angular momentum signature caused by an interaction of the first signal with chiral molecules within the sample.
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Abstract
An apparatus for identifying a material within a sample comprising signal generation circuitry generates a first signal including a first orbital angular momentum (OAM) signature and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and identifies the material within the sample based on a detected second orbital angular momentum caused by an interaction of the first signal with chiral molecules within the sample.
31 Citations
20 Claims
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1. An apparatus for identifying a material within a sample, comprising:
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signal generation circuitry for generating a first signal including a first orbital angular momentum (OAM) signature and applying the first signal to the sample; and a detector for receiving the first signal after the first signal passes through the sample and identifying the material within the sample based on a detected second orbital angular momentum signature caused by an interaction of the first signal with chiral molecules within the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method for identifying a material within a sample, comprising:
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generating a first signal including a first orbital angular momentum (OAM) signature therein; applying the first signal to the sample; receiving the first signal after the first signal passes through the sample; and identifying the material within the sample based on a detected second orbital angular momentum signature caused by an interaction of the first signal with chiral molecules within the sample. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A detector for identifying a material within a sample, comprising:
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an input interface for receiving a first signal having an orbital angular momentum (OAM) signature applied thereto caused by passing through the sample; detection circuitry for detecting the orbital angular momentum signature within the first signal and identifying the material within the sample based on the detected orbital angular momentum signature caused by an interaction of the first signal with chiral molecules within the sample as the first signal passes through the sample. - View Dependent Claims (20)
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Specification