×

System and method for detection of materials using orbital angular momentum signatures

  • US 10,048,202 B2
  • Filed: 08/15/2017
  • Issued: 08/14/2018
  • Est. Priority Date: 07/24/2014
  • Status: Active Grant
First Claim
Patent Images

1. An apparatus for identifying a material within a sample, comprising:

  • signal generation circuitry for generating a first signal including a first orbital angular momentum (OAM) signature and applying the first signal to the sample; and

    a detector for receiving the first signal after the first signal passes through the sample and identifying the material within the sample based on a detected second orbital angular momentum signature caused by an interaction of the first signal with chiral molecules within the sample.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×