Method for manufacturing semiconductor device
First Claim
1. A semiconductor device comprising:
- a gate electrode over a substrate;
a gate insulating film over the gate electrode;
an oxide semiconductor film over the gate insulating film, the oxide semiconductor film including In, M, and Zn, wherein M represents Al, Ti, Ga, Y, Zr, La, Ce, Nd, or Hf;
a pair of electrodes over the oxide semiconductor film, the pair of electrodes including copper; and
an oxide film between the oxide semiconductor film and the pair of electrodes, the oxide film including In, M, and Zn,wherein the oxide semiconductor film includes a region serving as a channel region,wherein the oxide film has a non-single-crystal structure and includes a c-axis aligned crystal,wherein a proportion of M atoms in the oxide film is higher than a proportion of M atoms in the oxide semiconductor film, andwherein an atomic ratio of metal element in the oxide film satisfies M>
In and Zn >
M.
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Abstract
To reduce defects in an oxide semiconductor film in a semiconductor device. To improve electrical characteristics of and reliability in the semiconductor device including an oxide semiconductor film. A method for manufacturing a semiconductor device includes the steps of forming a gate electrode and a gate insulating film over a substrate, forming an oxide semiconductor film over the gate insulating film, forming a pair of electrodes over the oxide semiconductor film, forming a first oxide insulating film over the oxide semiconductor film and the pair of electrodes by a plasma CVD method in which a film formation temperature is 280° C. or higher and 400° C. or lower, forming a second oxide insulating film over the first oxide insulating film, and performing heat treatment at a temperature of 150° C. to 400° C. inclusive, preferably 300° C. to 400° C. inclusive, further preferably 320° C. to 370° C. inclusive.
189 Citations
20 Claims
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1. A semiconductor device comprising:
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a gate electrode over a substrate; a gate insulating film over the gate electrode; an oxide semiconductor film over the gate insulating film, the oxide semiconductor film including In, M, and Zn, wherein M represents Al, Ti, Ga, Y, Zr, La, Ce, Nd, or Hf; a pair of electrodes over the oxide semiconductor film, the pair of electrodes including copper; and an oxide film between the oxide semiconductor film and the pair of electrodes, the oxide film including In, M, and Zn, wherein the oxide semiconductor film includes a region serving as a channel region, wherein the oxide film has a non-single-crystal structure and includes a c-axis aligned crystal, wherein a proportion of M atoms in the oxide film is higher than a proportion of M atoms in the oxide semiconductor film, and wherein an atomic ratio of metal element in the oxide film satisfies M>
In and Zn >
M. - View Dependent Claims (2, 3, 4, 5)
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6. A semiconductor device comprising:
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a gate electrode over a substrate; a gate insulating film over the gate electrode; an oxide semiconductor film over the gate insulating film, the oxide semiconductor film including In, Ga, and Zn; a pair of electrodes over the oxide semiconductor film, the pair of electrodes including copper; and an oxide film between the oxide semiconductor film and the pair of electrodes, the oxide film including In, Ga, and Zn, wherein the oxide semiconductor film includes a region serving as a channel region, wherein the oxide film has a non-single-crystal structure and includes a c-axis aligned crystal, wherein a proportion of Ga atoms in the oxide film is higher than a proportion of Ga atoms in the oxide semiconductor film, and wherein an atomic ratio of metal element in the oxide film satisfies Ga>
In and Zn>
Ga. - View Dependent Claims (7, 8, 9, 10)
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11. A semiconductor device comprising:
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a gate electrode over a substrate; a gate insulating film over the gate electrode; an oxide semiconductor film over the gate insulating film; a pair of electrodes over the oxide semiconductor film, the pair of electrodes including copper; and an oxide film between the oxide semiconductor film and the pair of electrodes, wherein the oxide semiconductor film includes a region serving as a channel region, wherein the oxide film has a non-single-crystal structure and includes a c-axis aligned crystal, wherein an energy at a conduction band bottom of the oxide film is closer to a vacuum level than an energy at a conduction band bottom of the oxide semiconductor film, and wherein a difference between an energy at the conduction band bottom of the oxide film and an energy at the conduction band bottom of the oxide semiconductor film is 0.05 eV or more and 2 eV or less. - View Dependent Claims (12, 13, 14, 15)
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16. A semiconductor device comprising:
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a gate electrode over a substrate; a gate insulating film over the gate electrode; an oxide semiconductor film over the gate insulating film, the oxide semiconductor film including In, Ga and Zn; a pair of electrodes over the oxide semiconductor film, the pair of electrodes including copper; and an oxide film between the oxide semiconductor film and the pair of electrodes, the oxide film including In, Ga, and Zn, wherein the oxide semiconductor film includes a region serving as a channel region, wherein the oxide film has a non-single-crystal structure and includes a c-axis aligned crystal, wherein an energy at a conduction band bottom of the oxide film is closer to a vacuum level than an energy at a conduction band bottom of the oxide semiconductor film, and wherein a difference between an energy at the conduction band bottom of the oxide film and an energy at the conduction band bottom of the oxide semiconductor film is 0.05 eV or more and 2 eV or less. - View Dependent Claims (17, 18, 19, 20)
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Specification