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Temperature-measurement probe

  • US 10,054,498 B2
  • Filed: 07/28/2017
  • Issued: 08/21/2018
  • Est. Priority Date: 12/31/2009
  • Status: Active Grant
First Claim
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1. A temperature-measurement probe, comprising:

  • a probe body;

    a first circuit segment residing within the temperature-measurement probe including a communication node and having an electrical characteristic sensitive to a probe temperature at a location within the probe body, the first circuit segment generating circuit measurement data and including a memory configured to store temperature-correlation information, whereinthe temperature-correlation information includes a first customized procedural model correlating the circuit-measurement data with the probe temperature and a target temperature, and in which the communication node is configured for communication with a second circuit segment, the second circuit segment being configured to receive the temperature-correlation information including the first customized procedural model and circuit measurement data from the first circuit segment to estimate the probe temperature and the target temperature, wherein the second circuit segment is configured to process a second customized procedural model of a second temperature-measurement probe interchangeable with the first temperature-measurement probe, and in which the second customized procedural model is different from the first customized procedural model.

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