Systems and methods for correction of frequency spectrum in dual comb spectroscopy
First Claim
1. A method for correcting frequency offset in a dual comb spectroscopy system, said method comprising:
- causing a first laser (L1) generator to transmit L1 pulses at a repetition rate of a first frequency;
causing a second laser (L2) generator to transmit L2 pulses at a repetition rate of a second frequency, the second frequency different from the first frequency;
interrogating a reference material using a combination of a first portion of the L1 pulses and a first portion of the L2 pulses;
capturing reference cell pulses that include the combination of the first portion of the L1 pulses and the first portion of the L2 pulses that interrogated the reference material;
interrogating a material of interest using a second portion of the L1 pulses;
capturing material of interest pulses that include the second portion of the L1 pulses that interrogated the material of interest; and
determining a frequency jitter based on the captured reference cell pulses and the combination of the captured material of interest pulses and a second portion of the L2 pulses.
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Accused Products
Abstract
A method for correcting frequency offset in a dual comb spectroscopy system is provided. The method includes causing a first laser (L1) generator to transmit L1 pulses at a repetition rate of a first frequency and causing a second laser (L2) generator to transmit L2 pulses at a repetition rate of a second frequency. The method also includes interrogating a reference material using a combination of the L1 pulses and the L2 pulses and capturing reference cell pulses. The method further includes interrogating a material of interest using the L1 pulses and capturing material of interest pulses. The method includes determining a frequency jitter based on the captured reference cell pulses and the combination of the captured material of interest pulses and the L2 pulses.
12 Citations
20 Claims
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1. A method for correcting frequency offset in a dual comb spectroscopy system, said method comprising:
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causing a first laser (L1) generator to transmit L1 pulses at a repetition rate of a first frequency; causing a second laser (L2) generator to transmit L2 pulses at a repetition rate of a second frequency, the second frequency different from the first frequency; interrogating a reference material using a combination of a first portion of the L1 pulses and a first portion of the L2 pulses; capturing reference cell pulses that include the combination of the first portion of the L1 pulses and the first portion of the L2 pulses that interrogated the reference material; interrogating a material of interest using a second portion of the L1 pulses; capturing material of interest pulses that include the second portion of the L1 pulses that interrogated the material of interest; and determining a frequency jitter based on the captured reference cell pulses and the combination of the captured material of interest pulses and a second portion of the L2 pulses. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A frequency offset correction system for correcting frequency offset in a dual comb spectroscopy system, said frequency offset correction system comprising:
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a first laser (L1) generator configured to transmit L1 pulses at a repetition rate of a first frequency; a second laser (L2) generator configured to transmit L2 pulses at a repetition rate of a second frequency, the second frequency different from the first frequency; a first combiner configured to combine a first portion of the L1 pulses and a first portion of the L2 pulses to interrogate a reference material; a reference detector configured to capture reference material pulses that include a combination of the first portion of the L1 pulses and the first portion of the L2 pulses that interrogated the reference material; an interrogation detector configured to capture material of interest pulses that include a second portion of the L1 pulses that interrogated the material of interest; and a controller configured to cause the first laser generator and the second laser generator to correct for frequency offset the L1 pulses and the L2 pulses, respectively, based on the captured reference material pulses and the captured material of interest pulses. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19)
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20. A controller for correcting frequency offset in a dual comb spectroscopy system, said controller including a processor coupled to a memory device, said controller is configured to correct frequency offset by:
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causing a first laser (L1) generator to transmit L1 pulses at a repetition rate of a first frequency; causing a second laser (L2) generator to transmit L2 pulses at a repetition rate of a second frequency, the second frequency different from the first frequency; capturing reference cell pulses that include the combination of the first portion of the L1 pulses and the first portion of the L2 pulses that interrogated a reference material; capturing material of interest pulses that include the second portion of the L1 pulses that interrogated a material of interest; determining a frequency jitter based on the captured reference cell pulses and the combination of the captured material of interest pulses and a second portion of the L2 pulses; determining whether the determined frequency jitter exceeds a predetermined jitter threshold, and in response to the determined frequency jitter exceeded the predetermined jitter threshold, causing a change in at least one of the following a pump power of the first laser generator and a pump power of the second laser generator.
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Specification