Method for three-dimensionally measuring a 3D aerial image of a lithography mask
First Claim
1. A method for three-dimensionally measuring a 3D aerial image in the region around an image plane during the imaging of a lithography mask, which is arranged in an object plane, while taking into account a selectable imaging scale ratio in mutually perpendicular directions with the following steps:
- reconstruction of an electromagnetic wavefront of imaging light after interaction thereof with the lithography mask,inclusion of an influencing variable that corresponds to the imaging scale ratio, andoutput of the 3D aerial image measured with the inclusion of the influencing variable.
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Abstract
In a method for three-dimensionally measuring a 3D aerial image in the region around an image plane during the imaging of a lithography mask, which is arranged in an object plane, a selectable imaging scale ratio in mutually perpendicular directions (x, y) is taken into account. For this purpose, an electromagnetic wavefront of imaging light is reconstructed after interaction thereof with the lithography mask. An influencing variable that corresponds to the imaging scale ratio is included. Finally, the 3D aerial image measured with the inclusion of the influencing variable is output. This results in a measuring method with which lithography masks that are optimized for being used with an anamorphic projection optical unit during projection exposure can also be measured.
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Citations
20 Claims
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1. A method for three-dimensionally measuring a 3D aerial image in the region around an image plane during the imaging of a lithography mask, which is arranged in an object plane, while taking into account a selectable imaging scale ratio in mutually perpendicular directions with the following steps:
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reconstruction of an electromagnetic wavefront of imaging light after interaction thereof with the lithography mask, inclusion of an influencing variable that corresponds to the imaging scale ratio, and output of the 3D aerial image measured with the inclusion of the influencing variable. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A metrology system for three-dimensionally measuring a 3D aerial image in the region around an image plane during the imaging of a lithography mask, which is arranged in an object plane, in which the metrology system is configured to take into account a selectable imaging scale ratio in mutually perpendicular directions with the following steps:
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reconstruction of an electromagnetic wavefront of imaging light after interaction thereof with the lithography mask, inclusion of an influencing variable that corresponds to the imaging scale ratio, and output of the 3D aerial image measured with the inclusion of the influencing variable; wherein the metrology system comprises; an illumination optical unit for illuminating the lithography mask to be examined, and an imaging optical unit for imaging the object towards a spatially resolving detection device. - View Dependent Claims (17, 18, 19, 20)
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Specification