Practical ion mobility spectrometer apparatus and methods for chemical and/or biological detection

• US 10,073,056 B2
• Filed: 12/19/2016
• Issued: 09/11/2018
• Est. Priority Date: 02/14/2006
• Status: Active Grant

• Current Assignee: Excellims Corporation
• Original Assignee: Excellims Corporation
• Inventors: Wu, Ching
• Primary Examiner(s): STOFFA, WYATT A
• Application Number:
  US15/383,736
• Publication Number:
  US 20170097321A1
• Time in Patent Office: 631 Days
• CPC Class Codes: G01N 27/622 Ion mobility spectrometry
• CPC Class Codes: H01J 49/004 Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn

Abstract

The present invention relates to ion mobility spectrometers. In one embodiment, the ion mobility spectrometer of the present invention uses a simplified ion mobility spectrometer design having helical resistive material to form substantially constant electric fields that guide ion movements. The drift tube for ion mobility spectrometers described herein is constructed with a non-conductive structure. This configuration provides a robust ion mobility spectrometer that is simple to build. One feature of the present invention is that the drift tube design described herein enables the ion mobility spectrometer to be built with a lower weight, lower power consumption, lower manufacturing cost, and free of sealants.

Claims

1. An ion mobility spectrometer comprising:

a) at least one dielectric structure component;

b) at least one ion guide electrode that is affixed on the dielectric structure or structures, wherein the ion guide electrode or electrodes are arranged in a helical shape or serpentine shape;

c) an electric field gradient being generated using the ion guide electrode or electrodes; and

d) an ion gate that is placed at one end of a drift region.

2. The IMS of claim 1, wherein the dielectric structure is made of aluminum nitride, beryllium oxide, fused silica, quartz, or alumina, having a cross section in a shape of round, square, or rectangular.

3. The IMS of claim 1, wherein the dielectric structure has at least one substantially flat metalized substrate.

4. The IMS of claim 1, further comprises at least one electrical conductive leading contact in connection with the ion guiding electrodes.

5. The IMS of claim 1, further comprises at least one heating element.

6. The IMS of claim 5, wherein the heating element is mounted and/or affixed to the dielectric structure.

7. The IMS of claim 5, wherein the heating element is located on the other side of the dielectric material from the ion guide electrodes.

8. The IMS of claim 1, wherein the ion guide electrode is made of conductive or resistive material.

9. The IMS of claim 8, wherein the ion guide electrode is made of resistive material and is affixed on a cylindrical shape dielectric structure.

10. The IMS of claim 3, wherein the flat metalized substrate has a metalized serpentine pattern.

11. The IMS of claim 9, wherein the ion guide electrode has a helical shape.

12. The IMS of claim 9, wherein the ion guide electrode has a serpentine shape.

13. The IMS of claim 8, wherein the ion guide electrode is made of resistive material and is affixed on a flat dielectric structure.

14. The IMS of claim 13, wherein the ion guide electrode has a serpentine pattern.

15. The IMS of claim 1, wherein the ion guide electrode consists of multiple segments.

16. The IMS of claim 15, wherein different segments of the ion guide electrode have different resistivities.