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Directional pulse injection into a microelectronic system for electrostatic test

  • US 10,082,534 B2
  • Filed: 06/17/2015
  • Issued: 09/25/2018
  • Est. Priority Date: 06/17/2015
  • Status: Active Grant
First Claim
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1. An apparatus comprising:

  • a pulse source to produce an electrical pulse;

    a test pulse transmission line coupled to the pulse source;

    a transformer coupled to the pulse source through the transmission line and to a conductive trace of a test board to apply the electrical pulse to the trace as a test pulse, the test board being connected to a microelectronic device under test, wherein the trace has a contact coupled to the device under test;

    a cancellation pulse transmission line coupled to the pulse source; and

    a cancellation pulse contact coupled to the pulse source through the cancellation pulse transmission line and to the trace on a side of the trace opposite the transformer to receive a cancellation signal from the pulse source and to couple the cancellation signal to the trace to cancel a portion of the test pulse.

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