Sensor power management
First Claim
1. An apparatus for collecting measurements of a process, comprising:
- a sensor circuitry including one or more sensors, to collect measurements of the process;
a power source coupled with the sensor circuitry to supply power to the one or more sensors; and
one or more sensor management and data processing modules coupled with the sensor circuitry, to regulate the power source in supplying power to the one or more sensors and operation of the one or more sensors, which includes to;
operate the power source to power on the one or more sensors, to measure the process at a first sampling rate, in a first data measurement mode, over a time period;
determine a pattern of events making up the process, based on the measurements collected by the one or more sensors in the first data measurement mode over the time period, wherein to determine the pattern of events includes to identify data points of the process and time intervals during which the data points are to be measured by the one or more sensors, wherein the pattern includes appearance of the identified data points in the identified time intervals;
operate the power source to power on the one or more sensors to measure the process in a second data measurement mode, which includes to measure the data points at a second sampling rate during the identified time intervals, and refrain from the measurements at the first sampling rate between the identified time intervals, wherein the second sampling rate is different than the first sampling rate.
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Accused Products
Abstract
Embodiments of the present disclosure provide techniques and configurations for an apparatus to reduce sensor power consumption, in particular, through predictive data measurements by one or more sensors. In one instance, the apparatus may include one or more sensors and a sensor management module coupled with the sensors and configured to cause the sensors to initiate measurements of data indicative of a process in a first data measurement mode, determine a pattern of events comprising the process based on a portion of the measurements collected by the sensors in the first data measurement mode over a time period, and initiate measurements of the data by the one or more sensors in a second data measurement mode. The second data measurement mode may be based on the pattern of events comprising the process. The pattern may indicate a prediction of appearance of events in the process. Other embodiments may be described and/or claimed.
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Citations
13 Claims
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1. An apparatus for collecting measurements of a process, comprising:
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a sensor circuitry including one or more sensors, to collect measurements of the process; a power source coupled with the sensor circuitry to supply power to the one or more sensors; and one or more sensor management and data processing modules coupled with the sensor circuitry, to regulate the power source in supplying power to the one or more sensors and operation of the one or more sensors, which includes to; operate the power source to power on the one or more sensors, to measure the process at a first sampling rate, in a first data measurement mode, over a time period; determine a pattern of events making up the process, based on the measurements collected by the one or more sensors in the first data measurement mode over the time period, wherein to determine the pattern of events includes to identify data points of the process and time intervals during which the data points are to be measured by the one or more sensors, wherein the pattern includes appearance of the identified data points in the identified time intervals; operate the power source to power on the one or more sensors to measure the process in a second data measurement mode, which includes to measure the data points at a second sampling rate during the identified time intervals, and refrain from the measurements at the first sampling rate between the identified time intervals, wherein the second sampling rate is different than the first sampling rate. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A computer-implemented method, comprising:
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operating, by a computing device of a system, a power source coupled with a sensor circuitry of the system, to power on one or more sensors of the system, to cause the one or more sensors to perform measurements of a process in a first data measurement mode, at a first sampling rate, over a first time period; determining, by the computing device, a pattern of events making up the process, based on the measurements collected by the one or more sensors in the first data measurement mode over the first time period, including identifying data points of the process and time intervals during which the data points are to be measured by the one or more sensors, wherein the pattern includes appearance of the identified data points in the identified time interval; and operating, by the computing device, the power source to power on the one or more sensors to measure the process in a second data measurement mode, including measuring the data points at a second sampling rate during the identified time intervals, and refraining from the measurements at the first sampling rate between the identified time intervals, wherein the second sampling rate is different than the first sampling rate. - View Dependent Claims (9, 10)
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11. A non-transient computing device-readable storage medium having instructions that, in response to execution on a computing device of a system, cause the computing device to:
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operate a power source coupled with a sensor circuitry of the system, to power on one or more sensors of the system, to cause the one or more sensors to perform measurements of a process, in a first data measurement mode, which includes a periodic performance of the measurements of the process at a first sampling rate, over a time period; determine a pattern of events making up the process, based on the measurements collected by the one or more sensors in the first data measurement mode over the time period, wherein to determine the pattern of events includes to identify data points of the process and time intervals during which the data points are to be measured by the one or more sensors, wherein the pattern includes appearance of the identified data points in the identified time intervals; and operate the power source to power on the one or more sensors to measure the process in a second data measurement mode, which includes to measure data points at a second sampling rate during the identified time intervals, and refrain from performance of the measurements at the first sampling rate between the identified time intervals, wherein the second sampling rate is different than the first sampling rate. - View Dependent Claims (12, 13)
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Specification