Test board for semiconductor package, test system, and method of manufacturing semiconductor package
First Claim
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1. A test board comprising:
- a board substrate;
a device under test (DUT) socket connected to the board substrate and configured to accommodate a semiconductor package;
a test controller;
a wireless signal unit configured to wirelessly exchange signals with a server; and
a single wireless power unit configured to be wirelessly charged by an external source and configured to supply electric power to the test controller and the DUT socket,wherein the test controller is configured to independently perform a test on the semiconductor package accommodated in the DUT socket in response to a test pattern command being wirelessly received from the server via the wireless signal unit.
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Abstract
A test board includes: a board substrate; a device under test (DUT) socket connected to the board substrate and configured to accommodate a semiconductor package; a test controller; a wireless signal unit configured to wirelessly exchange signals with a server; and a wireless power unit configured to be wirelessly charged by an external source and configured to supply electric power to the test controller and the DUT socket, wherein the test controller is configured to independently perform a test on the semiconductor package accommodated in the DUT socket in response to a test pattern command being wirelessly received from the server via the wireless signal unit.
18 Citations
22 Claims
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1. A test board comprising:
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a board substrate; a device under test (DUT) socket connected to the board substrate and configured to accommodate a semiconductor package; a test controller; a wireless signal unit configured to wirelessly exchange signals with a server; and a single wireless power unit configured to be wirelessly charged by an external source and configured to supply electric power to the test controller and the DUT socket, wherein the test controller is configured to independently perform a test on the semiconductor package accommodated in the DUT socket in response to a test pattern command being wirelessly received from the server via the wireless signal unit. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A test system comprising:
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a server; and a plurality of test boards configured to wirelessly exchange signals with the server, wherein each of the plurality of test boards comprises; a single device under test (DUT) socket configured to accommodate a semiconductor package and configured to accommodate a single DUT, the single DUT attached on each of the plurality of test boards; a test controller configured to independently perform a test on the semiconductor package accommodated in the DUT socket in response to a test pattern command being wirelessly received from the server; and a wireless power unit configured to be wirelessly charged by an external source and configured to supply electric power to the test controller and the DUT socket. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 17, 18, 19)
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16. A test system comprising:
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a test board comprising; a board substrate; a wireless signal transceiver and a power storage and supply unit provided on a first side of the board substrate; and a power receiver provided on a second side opposite of the first side of the board substrate; and a power supply unit configured to charge the power storage and supply unit provided on the test board and comprising; a power generator; and a power transmitter, wherein the test board is provided on the power transmitter. - View Dependent Claims (20, 21, 22)
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Specification