Integrated magnetic field sensor and method of powering on and off a load

• US 10,088,533 B2
• Filed: 01/12/2016
• Issued: 10/02/2018
• Est. Priority Date: 01/14/2015
• Status: Active Grant

• Current Assignee: Allegro Microsystems Incorporated (Sanken Electric Company Limited)
• Original Assignee: Allegro Microsystems Incorporated (Sanken Electric Company Limited)
• Inventors: Rivas, Manuel, Monreal, Gerardo A., Graham, Christine M., Shoemaker, Eric G.
• Primary Examiner(s): Hammond, Dedei K
• Application Number:
  US14/993,495
• Publication Number:
  US 20160200245A1
• Time in Patent Office: 994 Days
• Field of Search: None
• CPC Class Codes: B60Q 3/20 for lighting specific fittings of passenger or driving compartments; mounted on specific fittings of passenger or driving compartments lighting for dashboards B60Q3/10
• CPC Class Codes: B60Q 3/30 for compartments other than passenger or driving compartments, e.g. luggage or engine compartments
• CPC Class Codes: B60Q 3/80 Circuits; Control arrangements for dashboards B60Q3/16; for mass transit vehicles B60Q3/47
• CPC Class Codes: G01R 33/007 Environmental aspects, e.g. temperature variations, radiation, stray fields G01R33/025 takes precedence
• CPC Class Codes: G01R 33/0082 Compensation, e.g. compensating for temperature changes
• CPC Class Codes: G01R 33/07 Hall effect devices
• CPC Class Codes: G01R 33/072 Constructional adaptation of the sensor to specific applications
• CPC Class Codes: G05F 3/08 wherein the variable is dc
• CPC Class Codes: H05B 45/18 using temperature feedback

Abstract

An integrated magnetic field sensor includes a magnetic field sensing circuit and a power driving circuit disposed upon or within a common substrate. A method of powering on and off a load uses the above integrated magnetic field sensor.

Claims

1. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package, wherein the integrated circuit package comprises a thermal pad configured to thermally couple the substrate to a circuit board;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state.

2. The integrated magnetic field sensor of claim 1, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current.

3. The integrated magnetic field sensor of claim 2, wherein the integrated magnetic field sensor is operable up to an environmental temperature of about one hundred twenty five degrees Celsius.

4. The integrated magnetic field sensor of claim 3, wherein the power driving circuit comprises:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

5. The integrated magnetic field sensor of claim 4, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

6. The integrated magnetic field sensor of claim 5, wherein the threshold temperature comprises a plurality of threshold temperatures and wherein the temperature compensation circuit is operable to reduce the higher power state of the power driving signal to a corresponding plurality of different reduced power states at environmental temperatures above respective ones of the plurality of threshold temperatures.

7. The integrated magnetic field sensor of claim 5, wherein the power driving circuit further comprises:

a slew limit circuit operable to limit a rate of change of the power driving signal between the higher power and lower power states.

8. The integrated magnetic field sensor of claim 5, further comprising:

a permanent magnet coupled to the integrated circuit package for generating the magnetic field.

9. The integrated magnetic field sensor of claim 5, wherein the integrated circuit package further comprises:

a conductor disposed upon or within the semiconductor substrate and proximate to the magnetic field sensing circuit, the conductor for generating the magnetic field.

10. The integrated magnetic field sensor of claim 1, wherein the magnetic field sensing circuit comprises:

a magnetic field sensing element disposed upon the semiconductor substrate;

a conductor disposed upon the semiconductor and proximate to the magnetic field sensing element; and

a self-test circuit operable to drive a current into the conductor to generate a self-test of the integrated magnetic field sensor.

11. The integrated magnetic field sensor of claim 1, wherein the magnetic field sensing circuit comprises:

a power on reset circuit operable to hold the two-state signal or to hold the power driving circuit into a condition to result in the lower power state for a predetermined time period following a time when power is applied to the integrated magnetic field sensor.

12. The integrated magnetic field sensor of claim 1, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, wherein the magnetic field sensing circuit comprises a Hall effect element having first, second, third, and fourth electrical connection nodes disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed upon the semiconductor substrate at a position to result in a predetermined thermal gradient direction at a position of the Hall effect element with respect to positions of the first, second, third, and fourth connections nodes.

13. The integrated magnetic field sensor of claim 1, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, and wherein the magnetic field sensing circuit comprises a Hall effect element disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed at a position upon the semiconductor substrate to result in a thermal gradient at a position of the Hall effect element smaller than one degree Celsius.

14. A method of powering on and off a load, comprising:

providing an integrated magnetic field sensor, the integrated magnetic field sensor comprising;

a semiconductor substrate disposed within an integrated circuit package, wherein the integrated circuit package comprises a thermal pad configured to thermally couple the substrate to a circuit board;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, the method further comprising;

sensing a change of the magnetic field with the integrated magnetic field sensor, wherein the higher power state and the lower power state are achieved at different respective strengths or angles of the magnetic field.

15. The method of claim 14, wherein the load is an automobile light.

16. The method of claim 15, further comprising:

generating the magnetic field with a back-biasing magnet, the magnetic field influenced by a ferromagnetic object.

17. The method of claim 15, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current.

18. The method of claim 17, wherein the integrated magnetic field sensor is operable up to an environmental temperature of about one hundred twenty five degrees Celsius.

19. The method of claim 18, wherein the power driving circuit comprises:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

20. The method of claim 19, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

21. The method of claim 20, wherein the threshold temperature comprises a plurality of threshold temperatures and wherein the temperature compensation circuit is operable to reduce the higher power state of the power driving signal to a corresponding plurality of different reduced power states at environmental temperatures above respective ones of the plurality of threshold temperatures.

22. The method of claim 20, wherein the power driving circuit further comprises:

a slew limit circuit operable to limit a rate of change of the power driving signal between the higher power and lower power states.

23. The method of claim 20, further comprising:

generating the magnetic field with a permanent magnet.

24. The method of claim 20, further comprising:

generating the magnetic field with a conductor.

25. The method of claim 14, wherein the magnetic field sensing circuit comprises:

a magnetic field sensing element disposed upon the semiconductor substrate;

a conductor disposed upon the semiconductor and proximate to the magnetic field sensing element; and

a self-test circuit operable to drive a current into the conductor to generate a self-test of the integrated magnetic field sensor.

26. The method of claim 14, wherein the magnetic field sensing circuit comprises:

a power on reset circuit operable to hold the two-state signal or to hold the power driving circuit into a condition to result in the lower power state for a predetermined time period following a time when power is applied to the integrated magnetic field sensor.

27. The method of claim 14, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, wherein the magnetic field sensing circuit comprises a Hall effect element having first, second, third, and fourth electrical connection nodes disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed at a position upon the semiconductor substrate to result in a predetermined thermal gradient direction at a position of the Hall effect element with respect to positions of the first, second, third, and fourth connections nodes.

28. The method of claim 14, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, and wherein the magnetic field sensing circuit comprises a Hall effect element disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed at a position upon the semiconductor substrate to result in a thermal gradient at a position of the Hall effect element smaller than one degree Celsius.

29. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package;

a permanent magnet coupled to the integrated circuit package for generating a magnetic field;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to the magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state.

30. The integrated magnetic field sensor of claim 29, wherein the power driving circuit comprises:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

31. The integrated magnetic field sensor of claim 30, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

32. The integrated magnetic field sensor of claim 30, wherein the threshold temperature comprises a plurality of threshold temperatures and wherein the temperature compensation circuit is operable to reduce the higher power state of the power driving signal to a corresponding plurality of different reduced power states at environmental temperatures above respective ones of the plurality of threshold temperatures.

33. A method of powering on and off a load, comprising:

providing an integrated magnetic field sensor, the integrated magnetic field sensor comprising;

a semiconductor substrate disposed within an integrated circuit package;

a permanent magnet coupled to the integrated circuit package for generating a magnetic field;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to the magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, the method further comprising;

sensing a change of the magnetic field with the integrated magnetic field sensor, wherein the higher power state and the lower power state are achieved at different respective strengths or angles of the magnetic field.

34. The method of claim 33, wherein the power driving circuit comprises:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

35. The method of claim 34, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

36. The method of claim 34, wherein the threshold temperature comprises a plurality of threshold temperatures and wherein the temperature compensation circuit is operable to reduce the higher power state of the power driving signal to a corresponding plurality of different reduced power states at environmental temperatures above respective ones of the plurality of threshold temperatures.

37. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, wherein the power driving circuit comprises;

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

38. The integrated magnetic field sensor of claim 37, wherein the integrated magnetic field sensor further comprises a permanent magnet for generating the magnetic field.

39. The integrated magnetic field sensor of claim 37, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

40. The integrated magnetic field sensor of claim 37, wherein the threshold temperature comprises a plurality of threshold temperatures and wherein the temperature compensation circuit is operable to reduce the higher power state of the power driving signal to a corresponding plurality of different reduced power states at environmental temperatures above respective ones of the plurality of threshold temperatures.

41. A method of powering on and off a load, comprising:

providing an integrated magnetic field sensor, the integrated magnetic field sensor comprising;

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, wherein the power driving circuit comprises;

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature, the method further comprising;

sensing a change of the magnetic field with the integrated magnetic field sensor, wherein the higher power state and the lower power state are achieved at different respective strengths or angles of the magnetic field.

42. The method of claim 41, wherein the integrated magnetic field sensor further comprises a permanent magnet for generating the magnetic field.

43. The method of claim 41, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

44. The method of claim 41, wherein the threshold temperature comprises a plurality of threshold temperatures and wherein the temperature compensation circuit is operable to reduce the higher power state of the power driving signal to a corresponding plurality of different reduced power states at environmental temperatures above respective ones of the plurality of threshold temperatures.

45. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field, wherein the magnetic field sensing circuit comprises;

a magnetic field sensing element disposed upon the semiconductor substrate;

a conductor disposed upon the semiconductor and proximate to the magnetic field sensing element; and

a self-test circuit operable to drive a current into the conductor to generate a self-test of the integrated magnetic field sensor, wherein the integrated magnetic field sensor further comprises;

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state.

46. The integrated magnetic field sensor of claim 45, further comprising:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

47. The integrated magnetic field sensor of claim 46, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

48. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field, wherein the magnetic field sensing circuit comprises;

a power on reset circuit operable to hold the two-state signal or to hold the power driving circuit into a condition to result in the lower power state for a predetermined time period following a time when power is applied to the integrated magnetic field sensor, wherein the integrated magnetic field sensor further comprises;

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state.

49. The integrated magnetic field sensor of claim 48, further comprising:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

50. The integrated magnetic field sensor of claim 49, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

51. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, wherein the magnetic field sensing circuit comprises a Hall effect element having first, second, third, and fourth electrical connection nodes disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed upon the semiconductor substrate at a position to result in a predetermined thermal gradient direction at a position of the Hall effect element with respect to positions of the first, second, third, and fourth connections nodes.

52. The integrated magnetic field sensor of claim 51, further comprising:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

53. The integrated magnetic field sensor of claim 52, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

54. A method of powering on and off a load, comprising:

providing an integrated magnetic field sensor, the integrated magnetic field sensor comprising;

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, the method further comprising;

sensing a change of the magnetic field with the integrated magnetic field sensor, wherein the higher power state and the lower power state are achieved at different respective strengths or angles of the magnetic field, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, wherein the magnetic field sensing circuit comprises a Hall effect element having first, second, third, and fourth electrical connection nodes disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed upon the semiconductor substrate at a position to result in a predetermined thermal gradient direction at a position of the Hall effect element with respect to positions of the first, second, third, and fourth connections nodes.

55. The method of claim 54, further comprising:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

56. An integrated magnetic field sensor comprising:

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, and wherein the magnetic field sensing circuit comprises a Hall effect element disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed at a position upon the semiconductor substrate to result in a thermal gradient at a position of the Hall effect element smaller than one degree Celsius.

57. The integrated magnetic field sensor of claim 56, wherein the power driving circuit comprises:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.

58. The integrated magnetic field sensor of claim 57, wherein the threshold temperature is determined by a passive electronic component coupled to the integrated magnetic field sensor.

59. A method of powering on and off a load, comprising:

providing an integrated magnetic field sensor, the integrated magnetic field sensor comprising;

a semiconductor substrate disposed within an integrated circuit package;

a magnetic field sensing circuit disposed upon or within the substrate and operable to generate a two-state signal responsive to a magnetic field; and

a power driving circuit disposed upon or within the substrate and operable to generate, in response to the two-state signal, a power driving signal having a higher power state and a lower power state, the method further comprising;

sensing a change of the magnetic field with the integrated magnetic field sensor, wherein the higher power state and the lower power state are achieved at different respective strengths or angles of the magnetic field, wherein the higher power state is operable to provide at least one hundred seventy milliamps of current, and wherein the magnetic field sensing circuit comprises a Hall effect element disposed upon the semiconductor substrate, and wherein the power driving circuit is disposed at a position upon the semiconductor substrate to result in a thermal gradient at a position of the Hall effect element smaller than one degree Celsius.

60. The method of claim 59, wherein the power driving circuit comprises:

a temperature sensor disposed upon or within the substrate; and

a temperature compensation circuit responsive to the temperature sensor and operable to reduce the higher power state of the power driving signal to a reduced power state at environmental temperatures above a threshold temperature.