Method for determining a position of a structure element on a mask and microscope for carrying out the method
First Claim
Patent Images
1. A method for determining a position of a structure element on a mask, comprising the following steps:
- predefining a region on the mask which comprises at least the structure element,determining a phase image of the region, wherein the phase image comprises in a spatially resolved manner the phase of the imaging of the mask by the illumination radiation, anddetermining the position of the structure element within the phase image;
wherein, for determining the phase image, at least two aerial images of the region of the mask are recorded, wherein the at least two aerial images are recorded under diversified conditions determining the positioning error of the structure element as distance of the position of the structure element from a set point position of the structure element in the phase image.
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Abstract
A method and a microscope for determining a position of a structure element on a mask are provide. The method comprises predefining a region on the mask which comprises at least the structure element; determining a phase image of the region, wherein the phase image comprises in a spatially resolved manner the phase of the imaging of the mask by the illumination radiation; and determining the position of the structure element within the phase image.
23 Citations
27 Claims
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1. A method for determining a position of a structure element on a mask, comprising the following steps:
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predefining a region on the mask which comprises at least the structure element, determining a phase image of the region, wherein the phase image comprises in a spatially resolved manner the phase of the imaging of the mask by the illumination radiation, and determining the position of the structure element within the phase image; wherein, for determining the phase image, at least two aerial images of the region of the mask are recorded, wherein the at least two aerial images are recorded under diversified conditions determining the positioning error of the structure element as distance of the position of the structure element from a set point position of the structure element in the phase image. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A microscope comprising:
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an imaging optical unit for recording an aerial image of a predefined region on a mask which comprises at least a structure element, a detector for recording the aerial image, and an image processing device configured to carry out the following steps; predefining a region on the mask which comprises at least the structure element, determining a phase image of the region, wherein the phase image comprises in a spatially resolved manner the phase of the imaging of the mask by the illumination radiation, and determining the position of the structure element within the phase image, wherein, for determining the phase image, at least two aerial images of the region of the mask are recorded, wherein the at least two aerial images are recorded under diversified conditions determining the positioning error of the structure element as distance of the position of the structure element from a set point position of the structure element in the phase image, wherein aerial images recorded by the microscope are used. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A microscope comprising:
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an imaging optical unit for recording a phase image of a predefined region on a mask which comprises at least a structure element, a detector for recording the phase image, an image processing device configured to carry out the following steps; predefining a region on the mask which comprises at least the structure element, determining a phase image of the region, wherein the phase image comprises in a spatially resolved manner the phase of the imaging of the mask by the illumination radiation, and determining the position of the structure element within the phase image, wherein, for determining the phase image, at least two aerial images of the region of the mask are recorded, wherein the at least two aerial images are recorded under diversified conditions determining the positioning error of the structure element as distance of the position of the structure element from a set point position of the structure element in the phase image, wherein phase images recorded by the microscope are used. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27)
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Specification