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Systems and methods for testing electronic devices using master-slave test architectures

  • US 10,103,967 B2
  • Filed: 06/16/2017
  • Issued: 10/16/2018
  • Est. Priority Date: 11/10/2016
  • Status: Active Grant
First Claim
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1. A method comprising:

  • gathering first identifiers of a first plurality of devices under test coupled to a master test system;

    gathering second identifiers of a second plurality of devices under test coupled to a first slave test system coupled to the master test system;

    identifying a shared test protocol, the shared test protocol providing a basis to test compliance of a functional parameter shared by the first plurality of devices under test and the second plurality of devices under test;

    identifying a first resource test protocol, the first resource test protocol providing a basis to test compliance of a resource parameter of the first plurality of devices under test;

    identifying a second resource test protocol, the second resource test protocol providing a basis to test compliance of a resource parameter of the second plurality of devices under test;

    configuring a group of shared probes at the master test system to implement the shared test protocol on the first plurality of devices under test and the second plurality of devices under test;

    configuring a first group of resource probes at the master test system to implement the first resource test protocol on the first plurality of devices under test; and

    providing to the first slave test system instructions to configure a second group of resource probes at the first slave test system to implement the second resource test protocol on the second plurality of devices under test,wherein the method is executed by the master test system.

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