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Geodetic surveying device with a microlens array

  • US 10,107,624 B2
  • Filed: 08/07/2014
  • Issued: 10/23/2018
  • Est. Priority Date: 08/08/2013
  • Status: Active Grant
First Claim
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1. A theodolite device comprising:

  • a beam source for generating measurement radiation defining a measurement axis,a base defining a vertical axis,a telescopic sight for targeting an object by aligning the telescopic sight on the object,a support carrying the telescopic sight and defining a tilt axis, the support being arranged on the base and rotatable relative to the base about the vertical axis, and the telescopic sight being arranged rotatable relative to the support about the tilt axis,an angle- and distance-measuring functionality, anda control and processing unit,wherein the telescopic sight comprises an image acquisition unit for acquiring images of an object in a field of view;

    defined by the image acquisition unit, anddirected parallel to the measurement axis, andwherein the image acquisition unit at least comprises;

    an image sensor; and

    a microlens array with a plurality of diffractive and/or refractive optical elements arranged in a defined two-dimensional manner,wherein, during a measurement process by means of the image sensor, the image acquisition unit is configured to;

    acquire image pieces respectively generated by the diffractive and/or refractive optical elements and representing at least parts of the object, andgenerate an image data record representing the image pieces and comprising image information with a distance/focusing relation in respect of the field of view,wherein an image corresponding to a currently measured distance is generated based on the currently measured distance by the control and processing unit from the image data record in such a way that objects situated at the measured distance are depicted in the image with a first degree of sharpness and objects at a different distance are depicted with a lower degree of sharpness, wherein the currently measured distance is measured with the measurement radiation of the beam source.

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