Oxide semiconductor film, semiconductor device, and manufacturing method of semiconductor device
First Claim
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1. A semiconductor device comprising:
- an oxide semiconductor film including a channel region, a source region, and a drain region;
a gate electrode; and
a gate insulating film between the oxide semiconductor film and the gate electrode,wherein at least one of the source region and the drain region includes a plurality of low density regions having a lower density than a region between adjacent ones of the plurality of low density regions,wherein the at least one of the source region and the drain region includes hydrogen, andwherein the channel region does not include a low density region.
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Abstract
A highly reliable semiconductor device is manufactured by giving stable electric characteristics to a transistor in which an oxide semiconductor film is used. In a transistor using an oxide semiconductor film for an active layer, a microvoid is provided in a source region and a drain region adjacent to a channel region. By providing a microvoid in the source region and the drain region formed in an oxide semiconductor film, hydrogen contained in the channel region of an oxide semiconductor film can be captured in the microvoid.
158 Citations
20 Claims
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1. A semiconductor device comprising:
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an oxide semiconductor film including a channel region, a source region, and a drain region; a gate electrode; and a gate insulating film between the oxide semiconductor film and the gate electrode, wherein at least one of the source region and the drain region includes a plurality of low density regions having a lower density than a region between adjacent ones of the plurality of low density regions, wherein the at least one of the source region and the drain region includes hydrogen, and wherein the channel region does not include a low density region. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A semiconductor device comprising:
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an oxide semiconductor film including a channel region, a source region, and a drain region; a gate electrode; and a gate insulating film between the oxide semiconductor film and the gate electrode, wherein the source region and the drain region include a first region and a second region, wherein the first region has lower density than the second region, wherein the at least one of the source region and the drain region includes hydrogen, and wherein the channel region does not include a third region whose density is lower than a region which is adjacent to the third region. - View Dependent Claims (8, 9, 10, 11, 12, 13)
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14. A semiconductor device comprising:
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an oxide semiconductor film including a channel region, a source region, and a drain region; a gate electrode; and a gate insulating film between the oxide semiconductor film and the gate electrode, wherein the source region and the drain region include a first region and second region, wherein the first region is an empty space, wherein the at least one of the source region and the drain region includes hydrogen, and wherein the channel region does not include an empty space. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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Specification