Magneto-optical defect center magnetometer

• US 10,126,377 B2
• Filed: 08/09/2017
• Issued: 11/13/2018
• Est. Priority Date: 05/31/2016
• Status: Active Grant

• Current Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Original Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Inventors: Hahn, Joseph W., Manickam, Arul, Kaup, Peter G., Bruce, Gregory Scott, Lew, Wilbur, Luzod, Nicholas M., Huynh, Duc
• Primary Examiner(s): Nguyen, Tung X
• Assistant Examiner(s): Alejnikov, Jr., Robert P
• Application Number:
  US15/672,953
• Publication Number:
  US 20170363696A1
• Time in Patent Office: 461 Days
• Field of Search: 3242441, 2504581-4671
• CPC Class Codes: G01N 2021/1727 Magnetomodulation
• CPC Class Codes: G01N 2021/646 Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
• CPC Class Codes: G01N 21/64 Fluorescence; Phosphorescence
• CPC Class Codes: G01N 21/6489 Photoluminescence of semiconductors
• CPC Class Codes: G01N 21/87 Investigating jewels G01N21/88 takes precedence
• CPC Class Codes: G01N 2201/06113 Coherent sources; lasers
• CPC Class Codes: G01R 33/0023 Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration G01R33/0017 takes precedence
• CPC Class Codes: G01R 33/0047 Housings or packaging of magnetic sensors packaging of semiconductor devices H01L23/00; Holders
• CPC Class Codes: G01R 33/032 using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
• CPC Class Codes: G01R 33/1284 Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices G01R33/093 takes precedence; semiconductor devices using spin polarized carriers H01L29/66984
• CPC Class Codes: G01R 33/26 using optical pumping

Abstract

A magneto-optical defect center magnetometer, such as a diamond nitrogen vacancy (DNV) magnetometer, can include an excitation source, a magneto-optical defect center element, a collection device, a top plate, a bottom plate, and a printed circuit board. The excitation source, the magneto-optical defect center element, and the collection device are each mounted to the printed circuit board.

Claims

1. A magneto-optical defect center magnetometer assembly comprising:

a magneto-optical defect center element;

an excitation source;

a collection device;

an optical waveguide assembly that includes an optical waveguide and at least one optical filter coating, the optical filter coating applied to a surface of the optical waveguide, wherein the optical waveguide assembly is configured to transmit light emitted from the magneto-optical defect center element to the collection device; and

a printed circuit board;

wherein the excitation source, the magneto-optical defect center element, and the collection device are each mounted to the printed circuit board.

2. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical waveguide comprises a light pipe.

3. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical filter coating transmits greater than about 99% of light with a wavelength of about 650 nm to about 850 nm.

4. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical filter coating transmits less than 0.1% of light with a wavelength of less than about 600 nm.

5. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical filter coating transmits greater than about 99% of light with a wavelength of about 650 nm to about 850 nm, and transmits less than 0.1% of light with a wavelength of less than about 600 nm.

6. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical filter coating is disposed on an end surface of the optical waveguide adjacent the collection device.

7. The magneto-optical defect center magnetometer assembly of claim 1, wherein a first optical filter coating is disposed on an end surface of the optical waveguide adjacent the collection device, and a second optical filter coating is disposed on an end surface of the optical waveguide adjacent the diamond having nitrogen vacancies.

8. The magneto-optical defect center magnetometer assembly of claim 1, wherein the light pipe has an aperture with a size that is smaller than a size of the collection device.

9. The magneto-optical defect center magnetometer assembly of claim 1, wherein the light pipe has an aperture with a size greater than a size of a surface of the magneto-optical defect center element adjacent to the light pipe.

10. The magneto-optical defect center magnetometer assembly of claim 1, wherein the light pipe has an aperture with a size that is smaller than a size of the collection device and greater than a size of a surface of the magneto-optical defect center element adjacent the light pipe.

11. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical waveguide assembly further comprises an optical coupling material disposed between the light pipe and the magneto-optical defect center element, and the optical coupling material is configured to optically couple the light pipe to the magneto-optical defect center element.

12. The magneto-optical defect center magnetometer assembly of claim 1, wherein the optical waveguide assembly further comprises an optical coupling material disposed between the light pipe and the collection device, and the optical coupling material is configured to optically couple the light pipe to the collection device.

13. The magneto-optical defect center magnetometer assembly of claim 1, wherein an end surface of the light pipe adjacent to the magneto-optical defect center element extends in a plane parallel to a surface of the magneto-optical defect center element adjacent to the light pipe.

14. The magneto-optical defect center magnetometer assembly of claim 1, further comprising a second optical waveguide assembly and a second collection device, wherein the second optical waveguide assembly is configured to transmit light emitted from the magneto-optical defect center element to the second collection device.

15. A magneto-optical defect center magnetometer assembly comprising:

a magneto-optical defect center element;

an excitation source;

a collection device;

a printed circuit board;

an optical waveguide assembly that includes an optical waveguide and at least one optical filter coating, the optical filter coating applied to a surface of the optical waveguide, wherein the optical waveguide assembly is configured to transmit light emitted from the magneto-optical defect center element to the collection device;

excitation source circuitry mounted to the printed circuit board proximate to the excitation source; and

collection device circuitry mounted to the printed circuit board proximate to the collection device;

wherein the excitation source, the magneto-optical defect center element, and the collection device are each mounted to the printed circuit board.

16. The magneto-optical defect center magnetometer assembly of claim 15, wherein the excitation source is positioned along a first axis relative to the printed circuit board and wherein the collection device is positioned along a second axis relative to the printed circuit board.

17. The magneto-optical defect center magnetometer assembly of claim 15 further comprising an RF element mounted to the printed circuit board and RF amplifier circuitry mounted to the printed circuit board proximate to the RF device.

18. The magneto-optical defect center magnetometer assembly of claim 15, further comprising an optical filter, wherein the magneto-optical defect center element receives optical excitation based, at least in part, on generation of light corresponding to a first wavelength from the excitation source, wherein the collection device is configured to receive at least a first portion of light corresponding to a second wavelength, and wherein the optical filter is configured to provide at least a portion of light corresponding to the second wavelength to the collection device.

19. The magneto-optical defect center magnetometer assembly of claim 15, wherein the excitation source comprises an optical light source including a readout optical light source configured to provide optical excitation to the magneto-optical defect center element to transition relevant magneto-optical defect electrons to excited spin states in the magneto-optical defect center element and a reset optical light source configured to provide optical light to the magneto-optical defect center element to reset spin states in the magneto-optical defect center element to a ground state, wherein the reset optical light source provides a higher power light than the readout optical light source.

20. The magneto-optical defect center magnetometer assembly of claim 15, further comprising a radio frequency (RF) excitation source configured to provide RF excitation to the magneto-optical defect center element, the RF excitation source including an RF feed connector and a plurality of coils, each connected to the RF feed connector, and adjacent the magneto-optical defect center element, the coils arranged in layers one above another and to have a uniform spacing between each other.

21. The magneto-optical defect center magnetometer assembly of claim 15, wherein the magneto-optical defect center element is a diamond having nitrogen vacancies.

22. The magneto-optical defect center magnetometer assembly of claim 15, wherein the excitation source, the magneto-optical defect center element, and the collection device are each aligned and positioned relative to the top plate, bottom plate, and printed circuit board by a corresponding two-point orientation system.

23. A magneto-optical defect center magnetometer assembly comprising:

a magneto-optical defect center element;

an excitation source;

a collection device;

an RF element;

a printed circuit board;

an optical waveguide assembly that includes an optical waveguide and at least one optical filter coating, the optical filter coating applied to a surface of the optical waveguide, wherein the optical waveguide assembly is configured to transmit light emitted from the magneto-optical defect center element to the collection device;

excitation source circuitry mounted to the printed circuit board proximate to the excitation source;

collection device circuitry mounted to the printed circuit board proximate to the collection device; and

RF amplifier circuitry mounted to the printed circuit board proximate to the RF device;

wherein the excitation source, the magneto-optical defect center element, the collection device, and the RF element are each mounted to the printed circuit board and wherein the excitation source is positioned along a first axis relative to the printed circuit board and wherein the collection device is positioned along a second axis relative to the printed circuit board.

24. The magneto-optical defect center magnetometer assembly of claim 23, further comprising an optical filter, wherein the magneto-optical defect center element receives optical excitation based, at least in part, on generation of light corresponding to a first wavelength from the excitation source, wherein the collection device is configured to receive at least a first portion of light corresponding to a second wavelength, and wherein the optical filter is configured to provide at least a portion of light corresponding to the second wavelength to the collection device.

25. The magneto-optical defect center magnetometer assembly of claim 23, wherein the excitation source, the magneto-optical defect center element, and the collection device are each aligned and positioned relative to the top plate, bottom plate, and printed circuit board by a corresponding two-point orientation system.

26. The magneto-optical defect center magnetometer assembly of claim 23, wherein the excitation source comprises an optical light source including a readout optical light source configured to provide optical excitation to the magneto-optical defect center element to transition relevant magneto-optical defect electrons to excited spin states in the magneto-optical defect center element and a reset optical light source configured to provide optical light to the magneto-optical defect center element to reset spin states in the magneto-optical defect center element to a ground state, wherein the reset optical light source provides a higher power light than the readout optical light source.

27. The magneto-optical defect center magnetometer assembly of claim 23, further comprising a radio frequency (RF) excitation source configured to provide RF excitation to the magneto-optical defect center element, the RF excitation source including an RF feed connector and a plurality of coils, each connected to the RF feed connector, and adjacent the magneto-optical defect center element, the coils arranged in layers one above another and to have a uniform spacing between each other.

28. The magneto-optical defect center magnetometer assembly of claim 23, wherein the magneto-optical defect center element is a diamond having nitrogen vacancies.