Methods and systems for detecting cracks in electronic devices
First Claim
1. A method performed by one or more computing devices for detecting cracks in an electronic device, the method comprising:
- receiving an image of an electronic device;
automatically identifying a plurality of edges in the image;
for individual edges among the identified edges, determining whether another edge among the identified edges is present within a predetermined distance of each of the individual edges;
automatically identifying straight line segments corresponding to the individual edges for which another edge is within the predetermined distance; and
evaluating a condition of the electronic device based at least in part on the number of identified straight line segments.
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Accused Products
Abstract
Systems and methods for detecting cracks in an electronic device are disclosed. In one embodiment, the method includes receiving an image of a front side of a mobile device and automatically identifying edges in the image. For given edges among the identified edges, the method includes determining whether another edge among the identified edges is present within a predetermined distance of the given edge. Next, straight line segments corresponding to the edges for which another edge is within the predetermined distance are identified, and then a crack evaluation assessment is assigned to the mobile device based at least in part on the identified straight line segments.
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Citations
21 Claims
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1. A method performed by one or more computing devices for detecting cracks in an electronic device, the method comprising:
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receiving an image of an electronic device; automatically identifying a plurality of edges in the image; for individual edges among the identified edges, determining whether another edge among the identified edges is present within a predetermined distance of each of the individual edges; automatically identifying straight line segments corresponding to the individual edges for which another edge is within the predetermined distance; and evaluating a condition of the electronic device based at least in part on the number of identified straight line segments. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method performed by one or more computing devices for detecting cracks in an electronic device, the method comprising:
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receiving an image of an electronic device; automatically identifying a plurality of edges in the image; automatically determining whether individual edges among the identified edges are within a pre-selected proximity to other individual edges among the identified edges; and assessing the condition of the electronic device based at least in part on the number of the edges within the pre-selected proximity to other edges. - View Dependent Claims (10, 11, 12, 13)
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14. A method performed by one or more computing devices for detecting cracks in an electronic device, the method comprising:
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receiving an image of an electronic device; automatically identifying one or more edges in the image; identifying edge-to-non-edge-to-edge groupings among the identified edges; and assessing the condition of the electronic device based at least in part on the identified edge-to-non-edge-to-edge groupings, wherein, in the assessment, the edges in the identified edge-to-non-edge-to-edge groupings have greater weight than other edges among the identified edges. - View Dependent Claims (15, 16)
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17. A computer-readable memory carrying computer-executable instructions for causing one or more processors to facilitate detecting cracks in an electronic device, the computer-executable instructions comprising instructions that, when executed by the one or more processors:
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receive an image of an electronic device; automatically identify edges in the image; for individual edges among the identified edges, determine whether another edge among the identified edges is present within a predetermined distance of the individual edge; automatically identify straight line segments corresponding to the edges for which another edge is within the predetermined distance; and evaluate a condition of the electronic device based at least in part on the identified straight line segments. - View Dependent Claims (18, 19, 20, 21)
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Specification