System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials
First Claim
1. An apparatus that detects a material within a sample, comprising:
- signal generation circuitry that generates a first light beam having at least one fractional orbital angular momentum applied thereto and applies the first light beam to the sample, the at least one fractional orbital angular momentum imparting a phase factor, wherein the signal generation circuitry comprises a spiral phase plate having fraction step height to impart the at least one fractional orbital angular momentum to the first light beam; and
a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to detection of a predetermined phase factor within the first light beam received from the sample.
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Abstract
An apparatus that detects a material within a sample includes signal generation circuitry that generates a first light beam having at least one fractional orbital angular momentum applied thereto and applies the first light beam to the sample. The at least one fractional orbital angular momentum imparts a phase factor to the first light beam. The orbital angular momentum generation circuitry includes a spiral phase plate having fraction step height to impart the at least one angular momentum to the first light beam. A detector receives the first light beam after the first light beam passes through the sample and detects the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.
31 Citations
20 Claims
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1. An apparatus that detects a material within a sample, comprising:
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signal generation circuitry that generates a first light beam having at least one fractional orbital angular momentum applied thereto and applies the first light beam to the sample, the at least one fractional orbital angular momentum imparting a phase factor, wherein the signal generation circuitry comprises a spiral phase plate having fraction step height to impart the at least one fractional orbital angular momentum to the first light beam; and a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to detection of a predetermined phase factor within the first light beam received from the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for determining a material within a sample, comprising:
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generating a first light beam having at least one fractional orbital angular momentum applied thereto using a spiral phase plate having fraction step height to impart the at least one fractional orbital angular momentum to the first light beam, the at least one fractional orbital angular momentum imparting a phase factor to the first light beam; applying the first light beam to the sample; receiving the first light beam after the first light beam passes through the sample; detecting a predetermined phase factor within the received first light beam; and determining the material within the sample based on the detected predetermined phase factor within the first light beam received from the sample. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. An apparatus that detects a material within a sample, comprising:
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signal generation circuitry that generates a first light beam having at least one fractional orbital angular momentum applied thereto and applies the first light beam to the sample, the at least one fractional orbital angular momentum imparting a phase factor to the first light beam, wherein the signal generation circuitry uses spatial holograms to impart the at least one fractional orbital angular momentum to the first light beam; and a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to detection of a predetermined phase factor within the first light beam received from the sample. - View Dependent Claims (16, 17, 18, 19)
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20. A method for determining a material within a sample, comprising:
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generating a first light beam having at least one fractional orbital angular momentum applied thereto using spatial holograms to impart the at least one fractional orbital angular momentum to the first light beam, the at least one fractional orbital angular momentum imparting a phase factor to the first light beam; applying the first light beam to the sample; receiving the first light beam after the first light beam passes through the sample; detecting a predetermined phase factor within the received first light beam; and determining the material within the sample based on the detected predetermined phase factor within the first light beam received from the sample.
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Specification