Technique for increasing the sensitivity of capacitive sense arrays
First Claim
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1. A method comprising:
- measuring a first capacitance of a first plurality of electrodes at a first time, wherein the measured first capacitance is indicative of a first combined capacitance of the first plurality of electrodes;
measuring a second capacitance of a second plurality of electrodes at a second time, wherein the measured second capacitance is indicative of a second combined capacitance of the second plurality of electrodes and wherein the first plurality of electrodes and the second plurality of electrodes comprises at least one electrode in common and at least one electrode that is not in common; and
calculating a position of a conductive object based on a relative magnitude of the measured first capacitance and the measured second capacitance.
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Abstract
A technique for operating a capacitive sensor array is described. The technique includes measuring a first capacitance of a first set of electrodes at a first time, measuring a second capacitance of a second set of electrodes at a second time, and calculating a position of a conductive object based on a relative magnitude of the first capacitance and the second capacitance. The first set and the second set includes at least one electrode in common and at least one electrode that is not in common.
185 Citations
20 Claims
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1. A method comprising:
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measuring a first capacitance of a first plurality of electrodes at a first time, wherein the measured first capacitance is indicative of a first combined capacitance of the first plurality of electrodes; measuring a second capacitance of a second plurality of electrodes at a second time, wherein the measured second capacitance is indicative of a second combined capacitance of the second plurality of electrodes and wherein the first plurality of electrodes and the second plurality of electrodes comprises at least one electrode in common and at least one electrode that is not in common; and calculating a position of a conductive object based on a relative magnitude of the measured first capacitance and the measured second capacitance. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A non-transitory machine-readable medium that stores instructions that when executed by a processing device cause the processing device to:
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measure a first capacitance of a first plurality of electrodes at a first time, wherein the measured first capacitance is indicative of a first combined capacitance of the first plurality of electrodes; measure a second capacitance of a second plurality of electrodes at a second time, wherein the measured second capacitance is indicative of a second combined capacitance of the second plurality of electrodes and wherein the first plurality of electrodes and the second plurality of electrodes comprises at least one electrode in common and at least one electrode that is not in common; and calculate a position of a conductive object based on a relative magnitude of the measured first capacitance and the measured second capacitance. - View Dependent Claims (14)
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15. An apparatus comprising:
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a processing device; a user interface device operatively coupled to the processing device, wherein the user interface device comprises a first plurality of electrodes and a second plurality of electrodes, wherein the first plurality of electrodes and the second plurality of electrodes comprises at least one electrode in common and at least one electrode that is not in common, wherein the processing device is configured to; measure a first capacitance of the first plurality of electrodes at a first time, wherein the measured first capacitance is indicative of a first combined capacitance of the first plurality of electrodes; measure a second capacitance of the second plurality of electrodes at a second time, wherein the measured second capacitance is indicative of a second combined capacitance of the second plurality of electrodes; and calculate a position of a conductive object based on a relative magnitude of the measured first capacitance and the measured second capacitance. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification