Apparatus and method for determining statistics of electric current in an electrical system exposed to diffuse electromagnetic fields

• US 10,156,599 B2
• Filed: 12/16/2015
• Issued: 12/18/2018
• Est. Priority Date: 04/12/2011
• Status: Active Grant

• Current Assignee: Dassault Systemes Americas Corp. (Dassault Systemes SA), Paul G. Bremner
• Original Assignee: Dassault Systèmes Simulia Corp., Paul G. Bremner
• Inventors: Langley, Robin Stewart, Barbarulo, Andrea, Kovalevsky, Louis
• Primary Examiner(s): Schoenholtz, Joseph
• Application Number:
  US14/971,598
• Publication Number:
  US 20160103167A1
• Time in Patent Office: 1,098 Days
• Field of Search: None
• CPC Class Codes: G01N 27/02 by investigating impedance
• CPC Class Codes: G01R 13/02 for displaying measured electric variables in digital form
• CPC Class Codes: G01R 21/133 by using digital technique
• CPC Class Codes: G01R 23/16 Spectrum analysis; Fourier analysis
• CPC Class Codes: G01R 29/0814 Field measurements related to measuring influence on or from apparatus, components or humans EMC, EMI and similar testing in general G01R31/001, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
• CPC Class Codes: G01R 29/0892 Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
• CPC Class Codes: G01V 2210/6163 Electromagnetic
• CPC Class Codes: G01V 3/165 operating with magnetic or electric fields produced or modified by the object or by the detecting device with electromagnetic waves G01V3/17
• CPC Class Codes: G06F 17/18 for evaluating statistical data , e.g. average values, frequency distributions, probability functions, regression analysis forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04
• CPC Class Codes: G06F 30/23 using finite element methods [FEM] or finite difference methods [FDM]

Abstract

Some embodiments include an apparatus for determining statistics of the current in various wiring systems exposed to diffuse electromagnetic fields. Other embodiments of related apparatuses and methods are also disclosed.

Claims

1. An apparatus configured to determine one or more electromagnetic fields in one or more conductive elements of an electrical system, the one or more electromagnetic fields being caused by one or more electrical waves emitted by at least one electromagnetic wave creation element of the electrical system, the apparatus comprising:

one or more physical parameter sensors configured to measure physical parameters of the one or more conductive elements of the electrical system;

one or more electrical parameter sensors configured to measure electrical parameters of the at least one electromagnetic wave creation element of the electrical system;

a processing module; and

a non-transitory memory storage module storing computer instructions configured to run on the processing module, the processing module being configured to;

receive from the one or more physical parameter sensors two or more physical parameters of the one or more conductive elements;

receive from the one or more electrical parameter sensors one or more electrical parameters of the at least one electromagnetic wave creation element;

determine and store in memory at least one impedance matrix for the one or more conductive elements based on the two or more physical parameters and the one or more electrical parameters of the one or more conductive elements, the at least one impedance matrix representing electrical properties of the one or more conductive elements;

determine and store in memory a mean energy of the one or more electromagnetic fields in the one or more conductive elements based on the at least one impedance matrix for the one or more conductive elements; and

determine and store in memory an energy variance of the one or more electromagnetic fields in the one or more conductive elements based on the at least one impedance matrix for the one or more conductive elements;

determine, based on the mean energy and the energy variance of the one or more electromagnetic fields in the one or more conductive elements, one or more changes to at least one of (i) the one or more conductive elements, (ii) a region surrounding the one or more conductive elements, and (iii) the at least one electromagnetic wave creation element

determine a model of the one or more changes to the at least one of (i) the one or more conductive elements, (ii) a region surrounding the one or more conductive elements, and (iii) the at least one electromagnetic wave creation element.

2. The apparatus of claim 1 further comprising:

a display device coupled to the processing module;

wherein;

the acts further comprise displaying the model at the display device.

3. The apparatus of claim 1 wherein at least one of:

the one or more conductive elements are located in one of;

a vehicle comprising one of an automobile, an aircraft, or a ship;

or

an immobile structure;

or

the at least one electromagnetic wave creation element comprises at least one of a mobile communications device, an electromagnetic pulse weapon, or lightning.

4. The apparatus of claim 1 wherein:

each conductive element of the one or more conductive elements comprises an electrically conductive core and at least one coating.

5. The apparatus of claim 1 wherein:

the electrical system further comprises one or more conducting walls; and

the one or more conductive elements are in proximity to the one or more conducting walls.

6. The apparatus of claim 1 wherein:

the one or more conductive elements are bundled together in a bundle; and

each conductive element of the one or more conductive elements comprises one or more shielding layers.

7. The apparatus of claim 1 wherein:

the electrical system further comprises one or more electrical components; and

at least one of the one or more conductive elements is coupled with the one or more electrical components.

8. A method of determining one or more electromagnetic fields in one or more conductive elements of an electrical system, the one or more electromagnetic fields being caused by one or more electrical waves emitted by at least one electromagnetic wave creation element of the electrical system, the method comprising:

determining, using one or more physical parameter sensors, two or more physical parameters of the one or more conductive elements;

determining, using one or more electrical parameter sensors, one or more electrical parameters of the at least one electromagnetic wave creation element;

executing one or more first computer instructions configured to determine and store in memory at least one impedance matrix for the one or more conductive elements based on the two or more physical parameters and the one or more electrical parameters of the one or more conductive elements, the at least one impedance matrix representing electrical properties of the one or more conductive elements;

executing one or more second computer instructions configured to determine and store in memory a mean energy of the one or more electromagnetic fields in the one or more conductive elements based on the at least one impedance matrix for the one or more conductive elements;

executing one or more third computer instructions configured to determine and store in memory an energy variance of the one or more electromagnetic fields in the one or more conductive elements based on the at least one impedance matrix for the one or more conductive elements; and

executing one or more fourth computer instructions configured to use the mean energy and the energy variance of the one or more electromagnetic fields in the one or more conductive elements to determine one or more potential changes to at least one of (i) the one or more conductive elements and (ii) a region surrounding the one or more conductive elements;

wherein;

the one or more first computer instructions, the one or more second computer instructions, the one or more third computer instructions, and the one or more fourth computer instructions are configured to run at a processing module and configured to be stored at a non-transitory memory storage module, and the processing module is configured to perform the acts of the one or more first computer instructions, the one or more second computer instructions, the one or more third computer instructions, and the one or more fourth computer instructions; and

determining the one or more potential changes includes (i) modeling respective electromagnetic fields in the one or more conductive elements based on the mean energy of the one or more electromagnetic fields in the one or more conductive elements and the energy variance of the one or more electromagnetic fields in the one or more conductive elements, (ii) determining confidence bands of a maximum energy of the respective electromagnetic fields of the one or more conductive elements, and (iii) determining a probability that the maximum energy is equal to or greater than a predetermined energy level.

9. The method of claim 8 wherein:

the one or more potential changes comprise at least one of;

adding electromagnetic shielding to the one or more conductive elements;

or

moving the one or more conductive elements relative to the at least one electromagnetic wave creation element.

10. The method of claim 8 further comprising:

applying the one or more potential changes to the electrical system.

11. The method of claim 8 wherein:

executing the one or more first computer instructions, executing the one or more second computer instructions, and executing the one or more third computer instructions are performed for two or more electromagnetic frequencies.

12. The method of claim 8 further comprising:

executing one or more fourth computer instructions configured to determine a model of the one or more electromagnetic fields in the one or more conductive elements based upon (i) the mean energy of the one or more electromagnetic fields in the one or more conductive elements and (ii) the energy variance of the one or more electromagnetic fields in the one or more conductive elements.

13. The method of claim 12 wherein:

executing the one or more fourth computer instructions comprises;

executing one or more fifth computer instructions configured to determine confidence bands of a maximum energy of the one or more electromagnetic fields in the one or more conductive elements; and

executing one or more sixth computer instructions configured to determine a probability that the maximum energy of the one or more electromagnetic fields in the one or more conductive elements is equal to or greater than a predetermined energy level.

14. The method of claim 13 further comprising:

when the probability that the maximum energy of the one or more electromagnetic fields in the one or more conductive elements is equal to or greater than the predetermined energy level is larger than a predetermined value, applying one or more potential changes to at least one of (i) the one or more conductive elements, and (ii) a region surrounding the one or more conductive elements.

15. The method of claim 8 wherein:

determining the two or more physical parameters of the one or more conductive elements comprises determining at least one of;

one or more physical properties of the one or more conductive elements;

one or more locations of the one or more conductive elements relative to one or more walls;

one or more properties of one or more coatings on the one or more conductive elements;

or

one or more properties of one or more electrical components coupled with the one or more conductive elements as part of one or more electrical networks.

16. The method of claim 15 wherein:

the one or more physical properties of the one or more conductive elements comprises at least one of;

one or more diameters of the one or more conductive elements;

one or more lengths of the one or more conductive elements;

or

one or more material properties of the one or more conductive elements.

17. The method of claim 8 wherein:

executing the one or more first computer instructions comprises;

executing one or more fourth computer instructions configured to determine one or more initial impedance matrices for the one or more conductive elements in a Fourier domain;

executing one or more fifth computer instructions configured to transform the one or more initial impedance matrices for the one or more conductive elements to a spatial domain; and

executing one or more sixth computer instructions configured to determine one or more boundary condition impedance matrices representing one or more electrical components coupled with the one or more conductive elements and adding at least one boundary condition impedance matrix of the one or more boundary condition impedance matrices to at least one initial impedance matrix of the one or more initial impedance matrices for the one or more conductive elements to obtain the at least one impedance matrix for the one or more conductive elements.

18. The method of claim 8 wherein:

determining the one or more electrical parameters of the at least one electromagnetic wave creation element comprises at least one of;

determining an electric power of one or more frequencies of the one or more electromagnetic waves emitted by the at least one electromagnetic wave creation element;

or

determining at least one frequency of interest from the one or more frequencies of the one or more electromagnetic waves emitted by the electromagnetic wave creation element.

19. The method of claim 8 wherein:

executing the one or more second computer instructions comprises;

executing one or more fourth computer instructions determining a mean value of a cross-spectrum of one or more electric currents in the one or more conductive elements.

20. The method of claim 8 wherein:

executing the one or more third computer instructions comprises;

executing one or more fourth computer instructions configured to determine an energy variance of a cross-spectrum of one or more electric currents in the one or more conductive elements.

21. A method of determining one or more electromagnetic fields in one or more wires of an electrical system, the one or more electromagnetic fields being caused by one or more electrical waves emitted by at least one electromagnetic wave creation element of the electrical system, the method comprising:

executing one or more first computer instructions configured to identify, using one or more physical parameter sensors, two or more physical parameters of the one or more wires;

executing one or more second computer instructions configured to identify, using one or more electrical parameter sensors, one or more electrical parameters of the at least one electromagnetic wave creation element;

executing one or more third computer instructions configured to determine and store in memory at least one impedance matrix for the one or more conductive elements based on the two or more physical parameters and the one or more electrical parameters of the one or more conductive elements, the at least one impedance matrix representing electrical properties of the one or more conductive elements;

executing one or more fourth computer instructions configured to determine and store in memory a mean energy of the one or more electromagnetic fields in the one or more wires based on the at least one impedance matrix for the one or more conductive elements;

executing one or more fifth computer instructions configured to use the mean energy of the one or more electromagnetic fields in the one or more wires to determine one or more potential changes to at least one of (i) the one or more wires, (ii) a region surrounding the one or more wires, or (iii) the at least one electromagnetic wave creation element; and

executing one or more sixth computer instructions configured to model the one or more potential changes;

wherein;

the one or more first computer instructions, the one or more second computer instructions, the one or more third computer instructions, the one or more fourth computer instructions, the one or more fifth computer instructions, and the one or more sixth computer instructions are configured to run at a processing module and configured to be stored at a non-transitory memory storage module, and the processing module is configured to perform the acts of the one or more first computer instructions, the one or more second computer instructions, the one or more third computer instructions, the one or more fourth computer instructions, the one or more fifth computer instructions, and the one or more sixth computer instructions; and

modeling the one or more potential changes includes (i) modeling respective electromagnetic fields in the one or more conductive elements based on the mean energy of the one or more electromagnetic fields in the one or more conductive elements (ii) determining confidence bands of a maximum energy of the respective electromagnetic fields of the one or more conductive elements, and (iii) determining a probability that the maximum energy is equal to or greater than a predetermined energy level.