Ultrasonic and strain dual mode sensor for contact switch

• US 10,158,361 B2
• Filed: 06/30/2017
• Issued: 12/18/2018
• Est. Priority Date: 03/05/2014
• Status: Active Grant

• Current Assignee: Measurement Specialties Incorporated (TE Connectivity Limited)
• Original Assignee: Measurement Specialties Incorporated (TE Connectivity Limited)
• Inventors: Toda, Minoru, Park, Kyung- Tae
• Primary Examiner(s): Kumar, Srilakshmi K
• Assistant Examiner(s): WILLS-BURNS, CHINEYERE D
• Application Number:
  US15/640,105
• Publication Number:
  US 20170310321A1
• Time in Patent Office: 536 Days
• Field of Search: 345174
• CPC Class Codes: H03K 17/964 Piezoelectric touch switches
• CPC Class Codes: H03K 2217/94026 Automatic threshold calibration; e.g. threshold automatically adapts to ambient conditions or follows variation of input
• CPC Class Codes: H03K 2217/94036 Multiple detection, i.e. where different switching signals are generated after operation of the user is detected at different time instants at different locations during the actuation movement by two or more sensors of the same or different kinds
• CPC Class Codes: H03K 2217/96007 by reflection

Abstract

A device for detecting a touch at a surface of a substrate comprises a piezoelectric element positioned at a back surface of the substrate to be touched. A drive circuit is configured to apply a frequency modulated drive signal to the piezoelectric element to detect resonance at the substrate. A first detector arrangement coupled to the piezoelectric element is configured to generate a first output signal indicative of a sensed touch or no touch condition according to detected voltage changes and responsive to the frequency modulated drive signal applied to the piezoelectric element. A second detector arrangement coupled to the piezoelectric element is configured to generate a second output signal indicative of a sensed touch or no touch condition according to a sensed strain on said piezoelectric element. A decision circuit including a processor is configured to identify a touch condition or no touch condition at the surface of the substrate according to the first and second output signals.

Claims

1. A device for detecting a touch at a surface of a substrate, comprising:

a piezoelectric element positioned at a back surface of the substrate to be touched;

arrive circuit configured to apply a frequency modulated drive signal to the piezoelectric element to detect resonance at the substrate;

a first detector arrangement coupled to the piezoelectric element and configured to generate a first output signal indicative of a sensed touch condition or no touch condition according to detected voltage changes and responsive to the frequency modulated drive signal applied to the piezoelectric element;

a second detector arrangement coupled to said piezoelectric element and configured to generate a second output signal indicative of a sensed touch condition or no touch condition according to a sensed strain on said piezoelectric element; and

a decision circuit including a processor configured to identify a touch condition or no touch condition at the surface of the substrate according to the first and second output signals, wherein the second output signal from the sensed strain on the piezoelectric element determines the accuracy or validation of the touch/no touch condition.

2. The device of claim 1, wherein the decision circuit is configured to identify the touch condition or no-touch condition based on comparison of amplitudes of the first and second detector output signals.

3. The device of claim 1, wherein the decision circuit is configured to identify a touch condition or no-touch condition based on comparison of amplitudes of the first and second detector output signals and weighting of the first and second detector output signals.

4. The device of claim 3, wherein different weighting is applied to the first and second detector output signals, based on one or more rules associated with operation of said device.

5. The device of claim 4, wherein the one or more rules associated with operation of said device include weighting based on one or more environmental conditions.

6. The device of claim 5, wherein the one or more environmental conditions includes one or more of:

device vibration; and

, a surface contamination material on said device substrate.

7. The device of claim 1, further comprising a time duration detector for comparing the duration of a detected touch condition of the first output signal with a predetermined period and generating an output signal indicative of a false detection when said duration exceeds said predetermined period.

8. A method comprising:

applying a frequency modulated drive signal to a piezoelectric element positioned at a back surface of a substrate to be touched to detect resonance at the substrate;

detecting voltage changes of the piezoelectric element when said frequency modulated drive signal is applied and generating a first output signal indicative of a sensed touch or no touch condition according to said detected voltage changes;

detecting a voltage signal based on a sensed strain on said piezoelectric element and generating a second output signal indicative of a sensed touch condition or no touch condition in response thereto; and

determining a touch condition or no touch condition at the surface of the substrate according to the first and second output signals, wherein the second output signal from the sensed strain on the piezoelectric element determines the accuracy or validation of the touch/no touch condition.

9. The method of claim 8, wherein said determining the touch condition or no touch condition at the surface of the substrate according to the first and second output signals further comprises comparing amplitudes of the first and second detector output signals and weighting of the first and second detector output signals.

10. The method of claim 9, wherein different weighting is applied to the first and second detector output signals, based on one or more rules associated with operation of a device incorporating said piezoelectric element and substrate.

11. The method of claim 10, wherein the one or more rules associated with operation of said device include weighting based on one or more environmental conditions.

12. The method of claim 8, further comprising comparing a time duration of a detected touch condition of the first output signal with a predetermined period and generating an output signal indicative of a false detection when said duration exceeds said predetermined period.

13. A device for detecting a touch at a surface of a substrate, comprising:

a piezoelectric element positioned at a back surface of the substrate to be touched;

a drive circuit configured to apply a frequency modulated drive signal to the piezoelectric element to detect resonance at the substrate;

a first detector arrangement coupled to the piezoelectric element and configured to generate a first output signal indicative of a sensed touch condition or no touch condition according to detected voltage changes and responsive to the frequency modulated drive signal applied to the piezoelectric element;

a second detector arrangement coupled to said piezoelectric element and configured to generate a second output signal indicative of a sensed touch condition or no touch condition according to a sensed strain on said piezoelectric element; and

a decision circuit including a processor configured to identify a touch condition or no touch condition at the surface of the substrate according to the first and second output signals,

wherein the first detector arrangement includes a peak detector and a band pass amplifier responsive to said peak detector for generating said first output signal representing a sensed touch or no touch condition according to changes in pulse amplitude and duration based on resonance at the substrate; and

wherein the second detector arrangement includes a low pass amplifier for removing high frequency components for generating said second output signal representing a sensed touch or no touch condition based on detected strain of said piezoelectric element.