ECC and read adjustment based on dynamic memory error model estimation
First Claim
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1. A device comprising:
- a memory; and
a controller coupled to the memory, wherein the controller is configured todetermine a first count of bits of a representation of data stored in the memory that are estimated to be erroneous,determine a second count of bits of the representation of data that have high estimated reliability and are estimated to be erroneous,determine a third count of bits of the representation of data that have low estimated reliability and are estimated to be correct, andmodify at least one read parameter used in a read operation at the memory or at least one decode parameter used in decoding the representation of data based on the first count, the second count, and the third count.
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Abstract
A device includes a memory and a controller coupled to the memory. The controller is configured to determine a first count of bits of a representation of data that are estimated to be erroneous and a second count of bits of the representation of data that have high estimated reliability and are estimated to be erroneous. The controller is further configured to modify at least one read parameter or at least one decode parameter based on the first count and the second count.
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Citations
20 Claims
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1. A device comprising:
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a memory; and a controller coupled to the memory, wherein the controller is configured to determine a first count of bits of a representation of data stored in the memory that are estimated to be erroneous, determine a second count of bits of the representation of data that have high estimated reliability and are estimated to be erroneous, determine a third count of bits of the representation of data that have low estimated reliability and are estimated to be correct, and modify at least one read parameter used in a read operation at the memory or at least one decode parameter used in decoding the representation of data based on the first count, the second count, and the third count. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method performed by a controller of a device, the method comprising:
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determining a first count of bits of a representation of data stored in a memory of the device that are estimated to be erroneous; determining a second count of bits of the representation of data that have a high estimated reliability and are estimated to be erroneous; determining a third count of bits of the representation of data that have a low estimated reliability and are estimated to be correct; and modifying at least one read parameter used in a read operation at the memory or at least one decode parameter used in decoding the representation of data based at least on the first count and the second count. - View Dependent Claims (10, 11, 12, 13)
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14. An apparatus comprising:
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means for storing data; and means for modifying at least one read parameter used in a read operation at the means for storing data or at least one decode parameter used in decoding a representation of data stored in the means for storing data based on a first count of bits of the representation of data that are estimated to be erroneous, a second count of bits of the representation of data that have high estimated reliability and are estimated to be erroneous, and a third count of bits of the representation of data that have low estimated reliability and are estimated to be correct. - View Dependent Claims (15, 16)
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17. A device comprising:
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a memory; and a controller coupled to the memory, wherein the controller is configured to determine an estimated memory error model associated with a representation of data stored in the memory based at least in part on the representation of data and reliability information associated with the representation of data, and wherein the controller is further configured to modify at least one read parameter used in a read operation at the memory or at least one decode parameter used in decoding the representation of data based on the estimated memory error model, wherein the controller is further configured to determine the estimated memory error model by computing a count of bits of the representation of data that have low estimated reliability and are estimated to be correct. - View Dependent Claims (18, 19, 20)
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Specification