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System and method for multi-parameter spectroscopy

  • US 10,161,870 B2
  • Filed: 05/15/2018
  • Issued: 12/25/2018
  • Est. Priority Date: 10/05/2015
  • Status: Active Grant
First Claim
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1. An apparatus for detecting a material within a sample, comprising:

  • a light emitting unit for directing at least one light beam through the sample, the at least one light beam having a unique Raman intensity signature associated therewith responsive to passing through the sample;

    a spontaneous Raman spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing a spontaneous Raman spectroscopic analysis to detect a first Raman intensity signature associated with the sample, wherein the first Raman intensity signature relates to molecular vibrations caused by the material in the sample;

    a simulated Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a simulated Raman spectroscopic analysis to detect a second Raman intensity signature associated with the sample, wherein the second Raman intensity signature relates to molecular vibrations caused by the material within the sample;

    a database including a plurality of unique combinations of first Raman intensity signatures associated with spontaneous Raman spectroscopic analysis and second Raman intensity signatures associated with simulated Raman spectroscopic analysis, each of the plurality of unique combinations of the first and second Raman intensity signatures associated with a particular material; and

    a processor for detecting the material within the sample responsive to a comparison of the plurality of unique combinations of the first and second Raman intensity signatures detected by the spontaneous Raman spectroscopic unit and the simulated Raman spectroscopic unit with the plurality of unique combinations of the first and second Raman intensity signatures within the database and a determination of a matching unique combination of the first and second Raman intensity signatures within the database, wherein spontaneous Raman intensity is linearly dependent on an incident intensity and simulated Raman intensity is nonlinearly dependent on the incident intensity.

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