Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging
First Claim
1. A method for generating a super-resolution image for a specimen through a super-resolution system based on a low resolution image of the specimen comprising:
- obtaining the low resolution image of the specimen using a low resolution objective of a microscopy inspection system;
generating the super-resolution image of at least a portion of the specimen from the low resolution image of the specimen using a super-resolution image simulation;
identifying an accuracy assessment of the super-resolution image based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens identified using a simulated image classifier;
determining whether to further process the super-resolution image based on the accuracy assessment of the super-resolution image;
obtaining one or more high resolution images of the at least the portion of the specimen using a high resolution objective of the microscopy inspection system, if it is determined to further process the super-resolution image based on the accuracy assessment of the super-resolution image;
assembling the super-resolution image and the one or more high resolution images of the at least the portion of the specimen to form a single coherent image of the at least the portion of the specimen as part of further processing the super-resolution image;
identifying a total number of artifacts in the single coherent image of the at least the portion of the specimen;
comparing the total number of artifacts in the single coherent image with a pre-defined tolerance number of artifacts to determine a relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts; and
further controlling operation of the super-resolution system to generate one or more high resolution images for the specimen based on one or more low resolution images of the specimen according to the relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts.
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Accused Products
Abstract
Systems, methods, and computer-readable media for feedback on and improving the accuracy of super-resolution imaging. In some embodiments, a low resolution image of a specimen can be obtained using a low resolution objective of a microscopy inspection system. A super-resolution image of at least a portion of the specimen can be generated from the low resolution image of the specimen using a super-resolution image simulation. Subsequently, an accuracy assessment of the super-resolution image can be identified based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens identified using a simulated image classifier. Based on the accuracy assessment of the super-resolution image, it can be determined whether to further process the super-resolution image. The super-resolution image can be further processed if it is determined to further process the super-resolution image.
33 Citations
18 Claims
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1. A method for generating a super-resolution image for a specimen through a super-resolution system based on a low resolution image of the specimen comprising:
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obtaining the low resolution image of the specimen using a low resolution objective of a microscopy inspection system; generating the super-resolution image of at least a portion of the specimen from the low resolution image of the specimen using a super-resolution image simulation; identifying an accuracy assessment of the super-resolution image based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens identified using a simulated image classifier; determining whether to further process the super-resolution image based on the accuracy assessment of the super-resolution image; obtaining one or more high resolution images of the at least the portion of the specimen using a high resolution objective of the microscopy inspection system, if it is determined to further process the super-resolution image based on the accuracy assessment of the super-resolution image; assembling the super-resolution image and the one or more high resolution images of the at least the portion of the specimen to form a single coherent image of the at least the portion of the specimen as part of further processing the super-resolution image; identifying a total number of artifacts in the single coherent image of the at least the portion of the specimen; comparing the total number of artifacts in the single coherent image with a pre-defined tolerance number of artifacts to determine a relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts; and further controlling operation of the super-resolution system to generate one or more high resolution images for the specimen based on one or more low resolution images of the specimen according to the relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A super-resolution system comprising:
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a microscopy inspection system for inspecting a specimen comprising; a low resolution objective; a high resolution objective; one or more processors; and at least one non-transitory computer-readable storage medium having stored therein instructions which, when executed by the one or more processors, cause the one or more processors to perform operations comprising; obtaining a low resolution image of the specimen using the low resolution objective of a microscopy inspection system; generating a super-resolution image of at least a portion of the specimen from the low resolution image of the specimen using a super-resolution image simulation; identifying an accuracy assessment of the super-resolution image based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens; determining whether to further process the super-resolution image based on the accuracy assessment of the super-resolution image; obtaining one or more high resolution images of the at least the portion of the specimen using a high resolution objective of the microscopy inspection system, if it is determined to further process the super-resolution image based on the accuracy assessment of the super-resolution image; assembling the super-resolution image and the one or more high resolution images of the at least the portion of the specimen to form a single coherent image of the at least the portion of the specimen as part of further processing the super-resolution image; identifying a total number of artifacts in the single coherent image of the at least the portion of the specimen; comparing the total number of artifacts in the single coherent image with a pre-defined tolerance number of artifacts to determine a relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts; and further controlling operation of the super-resolution system to generate one or more high resolution images for the specimen based on one or more low resolution images of the specimen according to the relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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16. A non-transitory computer-readable storage medium having stored therein instructions which, when executed by one or more processors, cause the one or more processors to perform operations for generating a super-resolution image for a specimen based on a low resolution image of the specimen comprising:
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receiving the low resolution image of the specimen captured by a low resolution objective of a microscopy inspection system; generating the super-resolution image of at least a portion of the specimen from the low resolution image of the specimen using a super-resolution image simulation; identifying an accuracy assessment of the super-resolution image based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens identified using a simulated image classifier; determining whether to further process the super-resolution image based on the accuracy assessment of the super-resolution image; obtaining one or more high resolution images of the at least the portion of the specimen using a high resolution objective of the microscopy inspection system, if it is determined to further process the super-resolution image based on the accuracy assessment of the super-resolution image; assembling the super-resolution image and the one or more high resolution images of the at least the portion of the specimen to form a single coherent image of the at least the portion of the specimen as part of further processing the super-resolution image; identifying a total number of artifacts in the single coherent image of the at least the portion of the specimen; comparing the total number of artifacts in the single coherent image with a pre-defined tolerance number of artifacts to determine a relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts; and further controlling operation of the super-resolution system to generate one or more high resolution images for the specimen based on one or more low resolution images of the specimen according to the relation of the total number of artifacts in the single coherent image with the pre-defined tolerance number of artifacts.
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17. A method for generating a super-resolution image for a specimen through a super-resolution system based on a low resolution image of the specimen comprising:
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obtaining the low resolution image of the specimen using a low resolution objective of a microscopy inspection system; generating the super-resolution image of at least a portion of the specimen from the low resolution image of the specimen using a super-resolution image simulation; identifying an accuracy assessment of the super-resolution image based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens identified using a simulated image classifier trained using a plurality of known super-resolution images at two or more different image confidence determinations; determining whether to further process the super-resolution image based on the accuracy assessment of the super-resolution image; and further processing the super-resolution image if it is determined to further process the super-resolution image.
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18. A super-resolution system comprising:
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a microscopy inspection system for inspecting a specimen comprising; a low resolution objective; a high resolution objective; one or more processors; and at least one computer-readable storage medium having stored therein instructions which, when executed by the one or more processors, cause the one or more processors to perform operations comprising; obtaining a low resolution image of the specimen using the low resolution objective of a microscopy inspection system; generating a super-resolution image of at least a portion of the specimen from the low resolution image of the specimen using a super-resolution image simulation; identifying, by a simulated image classifier trained using a plurality of known super-resolution images at two or more different image confidence determinations, an accuracy assessment of the super-resolution image based on one or more degrees of equivalence between the super-resolution image and one or more actually scanned high resolution images of at least a portion of one or more related specimens; determining whether to further process the super-resolution image based on the accuracy assessment of the super-resolution image; and further processing the super-resolution image if it is determined to further process the super-resolution image.
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Specification