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On-chip supply noise voltage reduction or mitigation using local detection loops in a processor core

  • US 10,171,081 B1
  • Filed: 07/28/2017
  • Issued: 01/01/2019
  • Est. Priority Date: 07/28/2017
  • Status: Active Grant
First Claim
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1. A device, comprising:

  • a first voltage noise sensor located at a first unit of a processor core, wherein the first voltage noise sensor detects a first voltage droop at the first unit, and wherein the processor core is divided into the first unit and a second unit;

    a global noise manager component located in the processor core and associated with a global control loop of the processor core, and that receives, from the first voltage noise sensor, an indication of the first voltage droop; and

    a first local noise manager component located in the first unit and associated with a first local control loop of the first unit, where the first local noise manager component is distinct from the global noise manager component and;

    receives, from the first voltage noise sensor, the indication of the first voltage droop; and

    implements a first noise mitigation procedure at the first unit.

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