Performance and versatility of single-frequency DFT detectors

• US 10,180,485 B2
• Filed: 09/05/2015
• Issued: 01/15/2019
• Est. Priority Date: 09/05/2014
• Status: Active Grant

• Current Assignee: Leonid Matsiev
• Original Assignee: Leonid Matsiev
• Inventors: Matsiev, Leonid
• Primary Examiner(s): Wong, Albert K
• Application Number:
  US14/846,743
• Publication Number:
  US 20160069977A1
• Time in Patent Office: 1,228 Days
• Field of Search: None
• CPC Class Codes: G01R 27/02 Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

Abstract

Described herein are systems and methods for improving performance of single-frequency (single-point, single-bin) discrete Fourier transform (DFT) detectors by elimination of systematic errors from the detector output. Calibration procedures known in the art for practical implementations of such detectors do not provide adequate reduction of these systematic errors thus reducing utilization of these detectors in useful applications and products. The described methods, systems and devices allow such detectors to measure both DC and AC signals and, in latter case, considerably expand the operation frequency range without any additional hardware. These methods enable wide practical applications of DFT detectors across diverse variety of fields: from monitoring health of mechanical structures and fluid properties to impedimetric measurements in electrochemistry, monitoring of corrosion and bioimpedance.

Claims

1. A method of improving a signal measurement by a Digital Fourier Transform (DFT) Detector, comprising:

providing a DFT in combination with a test vector generator to form the DFT detector, wherein the test vector generator supplies discontinuous test vectors to the DFT at a plurality of selected frequencies and having a number of samples;

calculating in-phase gains, quadrature gains and crosstalk factors based on each of the selected frequencies and the number of samples of the discontinuous test vectors;

inputting a measurement signal into the DFT detector and receiving output values from the DFT detector wherein the output values include artifacts; and

removing the artifacts from the output values, by determining a corrected output using the output values, the in-phase gains, the quadrature gains and the crosstalk factors according to expression 3.

2. The method of improving a signal as recited in claim 1, wherein the measurement signal is synchronous with the discontinuous test vectors.

3. The method of improving a signal as recited in claim 1, wherein the calculation of in-phase gains, quadrature gains, and crosstalk factors is based on expression 2.

4. The method of improving a signal as recited in claim 1, wherein the selected frequencies includes all frequencies in the operating range of the DFT detector.

5. The method of improving a signal as recited in claim 1, wherein the method is performed using devices selected from the group consisting of:

AD5933, AD5934 and ADuCM350.