×

Systems and methods for automated optimization of a multi-mode inductively coupled plasma mass spectrometer

  • US 10,181,394 B2
  • Filed: 02/13/2015
  • Issued: 01/15/2019
  • Est. Priority Date: 02/14/2014
  • Status: Active Grant
First Claim
Patent Images

1. A system for automated optimization (tuning) of a multi-mode inductively coupled plasma mass spectrometer (ICP-MS), the system comprising:

  • a plasma gas source;

    an inductively coupled plasma torch (ICP torch) and RF coil for generating a plasma in which an analyte sample is introduced and from which an ion beam exits;

    a vacuum chamber into which the ion beam enters, wherein the vacuum chamber comprises a mass analyzer and detector for detection and/or quantification of analyte ionic species in the analyte sample; and

    a controller for carrying out an automated optimization routine, wherein the controller is operatively connected to a computer-readable medium comprising instructions, that, when executed, cause a processor to;

    receive user data input regarding an optimization to be performed on the ICP-MS for tuning of components of the ICP-MS for accurate detection and/or quantification of analyte ionic species in the analyte sample, wherein the user data input comprises an identification of one or more selected modes of operation in which the ICP-MS is to be operated;

    receive a user input for initiating an automated optimization routine for the tuning of components of the ICP-MS for accurate detection and/or quantification of analyte ionic species in the analyte sample; and

    following receipt of the user input for initiating the routine, transmit a first signal to the controller,wherein the first signal, when received, causes the controller to perform the automated optimization routine for the tuning of components of the ICP-MS, wherein the automated optimization routine comprises an ICP-MS performance assessment subsequence, said subsequence comprising the steps of(a) automatically conducting a first performance assessment comprising a preliminary evaluative check of instrument sensitivity, said preliminary evaluative check comprising comparing a sensitivity of a measurement of a calibration standard solution by the ICP-MS to predetermined instrument performance specifications, then,(i) responsive to a determination, by the processor, that the first performance assessment is unsatisfactory, ending the ICP-MS subsequence and identifying the ICP-MS performance assessment subsequence as failed, and(ii) responsive to a determination, by the processor, that the first performance assessment is satisfactory, conducting a second performance assessment, wherein the first performance assessment contains fewer steps and is less time consuming to conduct than the second performance assessment, then 

    (A) responsive to a determination, by the processor, that the second performance assessment is unsatisfactory, ending the ICP-MS subsequence and identifying the ICP-MS performance assessment subsequence as failed, and 

    (B) responsive to a determination, by the processor, that the second performance assessment is satisfactory, ending the subsequence and identifying the ICP-MS performance assessment subsequence as passed,wherein the instructions cause the processor, responsive to an identification of the ICP-MS performance assessment subsequence is as failed, to transmit a second signal to the controller, identifying the ICP-MS performance assessment subsequence as failed and tuning of the ICP-MS as being needed, wherein the second signal, when received by the controller, causes the controller to perform the tuning of the components of the ICP-MS, wherein the tuning comprises automatic adjustment of the ICP torch per an optimization subroutine, wherein the optimization subroutine comprises automatically adjusting an alignment of an X-Y position of the ICP torch relative to an ion optics assembly of the ICP-MS, wherein the X-Y position of the ICP torch corresponds to vertical and horizontal settings of the ICP torch.

View all claims
  • 3 Assignments
Timeline View
Assignment View
    ×
    ×