Probe card
First Claim
1. A probe card, comprising:
- a circuit board;
a transformer disposed on the circuit board, and including;
a body having a first surface and a second surface, wherein the first surface is located between the circuit board and the second surface;
a plurality of first solder balls disposed on the first surface; and
a plurality of first contact points disposed on the second surface;
a probe head disposed on the second surface, wherein the probe head is electrically connected to the first contact points, and is electrically connected to the circuit board through the first solder balls;
a reinforcement structure disposed between the probe head and the circuit board, wherein the first solder balls are connected between the first surface and the circuit board, the reinforcement structure includes an encapsulant disposed on the first surface and the encapsulant only covers the first solder balls, a thickness of the encapsulant measured from the first surface is greater than half of a height of each of the first solder balls measured from the first surface, and the thickness of the encapsulant measured from the first surface is less than the height of each of the first solder balls measured from the first surface, and wherein the first contact points are a plurality of bumps protruding from the second surface, the body has a plurality of openings, a trace of the transformer is disposed in each of the plurality of openings, and each of the first contact points fills in the corresponding opening and is connected to the corresponding trace; and
at least a flexible circuit board, wherein the circuit board has a plurality of first external contact points, the first external contact points are disposed on a surface of the circuit board and are located on the side of the transformer, the transformer further includes a plurality of second external contact points, the second external contact points are disposed on the second surface and are located on the side of the first contact points, and the at least flexible circuit board is connected between the first external contact points and the second external contact points.
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Accused Products
Abstract
A probe card including a circuit board, a transformer, a probe head, and a reinforcement structure is provided. The transformer including a body, a plurality of solder balls, and a plurality of first contact points are disposed on the substrate. The body has a first surface and a second surface, wherein the first surface is located between the circuit board and the second surface. The solder balls are disposed on the first surface, and the first contact points are disposed on the second surface. The probe head is disposed on the second surface. The probe head is electrically connected to the circuit board by the first solder balls. The reinforcement structure is disposed between the probe head and the circuit board.
5 Citations
6 Claims
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1. A probe card, comprising:
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a circuit board; a transformer disposed on the circuit board, and including; a body having a first surface and a second surface, wherein the first surface is located between the circuit board and the second surface; a plurality of first solder balls disposed on the first surface; and a plurality of first contact points disposed on the second surface; a probe head disposed on the second surface, wherein the probe head is electrically connected to the first contact points, and is electrically connected to the circuit board through the first solder balls; a reinforcement structure disposed between the probe head and the circuit board, wherein the first solder balls are connected between the first surface and the circuit board, the reinforcement structure includes an encapsulant disposed on the first surface and the encapsulant only covers the first solder balls, a thickness of the encapsulant measured from the first surface is greater than half of a height of each of the first solder balls measured from the first surface, and the thickness of the encapsulant measured from the first surface is less than the height of each of the first solder balls measured from the first surface, and wherein the first contact points are a plurality of bumps protruding from the second surface, the body has a plurality of openings, a trace of the transformer is disposed in each of the plurality of openings, and each of the first contact points fills in the corresponding opening and is connected to the corresponding trace; and at least a flexible circuit board, wherein the circuit board has a plurality of first external contact points, the first external contact points are disposed on a surface of the circuit board and are located on the side of the transformer, the transformer further includes a plurality of second external contact points, the second external contact points are disposed on the second surface and are located on the side of the first contact points, and the at least flexible circuit board is connected between the first external contact points and the second external contact points. - View Dependent Claims (2)
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3. A probe card, comprising:
- a circuit board having a plurality of first external contact points, disposed on a surface of the circuit board;
a transformer disposed on the circuit board, wherein the first external contact points are located on the side of the transformer, and the transformer includes;
a body having a first surface and a second surface, wherein the first surface is located between the circuit board and the second surface;
a plurality of first solder balls disposed on the first surface;
a plurality of first contact points disposed on the second surface;
a plurality of second external contact points disposed on the second surface and located on the side of the first contact points; and
wherein the contact points are plurality of bumps protruding from the second surface, the body has a plurality of openings, a trace of the transformer is disposed in each of the plurality of openings, and each of the first contact points fills in the corresponding opening and is connected to the corresponding trace;
a probe head disposed on the second surface, wherein the probe head is electrically connected to the first contact points, and is electrically connected to the circuit board through the first solder balls; and
at least a flexible circuit board connected between the first external contact points and the second external contact points. - View Dependent Claims (4, 5, 6)
- a circuit board having a plurality of first external contact points, disposed on a surface of the circuit board;
Specification