Encoder

• US 10,190,893 B2
• Filed: 12/20/2016
• Issued: 01/29/2019
• Est. Priority Date: 12/22/2015
• Status: Active Grant

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: Kimura, Akihide
• Primary Examiner(s): LEE, JOHN R
• Application Number:
  US15/384,628
• Publication Number:
  US 20170176219A1
• Time in Patent Office: 770 Days
• CPC Class Codes: G01D 5/34746 Linear encoders
• CPC Class Codes: G01D 5/38 by diffraction gratings

Abstract

A scale has a first pattern area and a second pattern areas disposed with an offset from the first pattern area in a measurement direction by 1/(2×s) of pitch. A detection head detects interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result. A signal processing unit detects a reference position based on a position where light intensity is lower than a predetermined value which appears in a light intensity distribution of the interference fringes, and detects incremental positions based on the interference fringes which appear at other positions. The detection head includes a light source, a detecting unit configured to output the detection result of the beams radiated onto light receiving devices to the signal processing unit, and an optical system configured to image positive s-th-order diffracted beams and negative s-th-order diffracted beams on the detecting unit.

Claims

1. An encoder comprising:

a scale having a plurality of pattern areas having a plurality of patterns arranged in a measurement direction with an equal predetermined pitch and including at least one pattern area disposed with an offset, in the measurement direction, from a neighboring pattern area by 1/(2×

s) of the predetermined pitch (wherein “

s”

is an integer of 1 or greater), the plurality of patterns comprising at least first and second patterns, each of which comprises a plurality of spaced pattern elements, that are linearly arranged in the measurement direction;

a detection head configured to be relatively movable in the measurement direction with respect to the scale, and detect interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result; and

a signal processor configured to detect a reference position based on a position where light intensity is lower than a predetermined value which appears in a light intensity distribution of the interference fringes, and detect incremental positions based on the interference fringes which appear at positions other than the position where light intensity is lower than the predetermined value,

wherein, the detection head includes;

a light source configured to radiate beams onto the scale;

a detecting unit, arranged in parallel with the scale, having a plurality of light receiving devices aligned along the measurement direction to obtain the light intensity distribution, and configured to output the detection result of the beams radiated onto the plurality of light receiving devices, to the signal processor; and

an optical system disposed between the scale and the detecting unit, and configured to image positive s-th-order diffracted beams and negative s-th-order diffracted beams generated when the beams are radiated onto the scale, on the detecting unit.

2. The encoder according to claim 1, wherein:

the optical system includes;

a first mirror disposed such that its mirror surface is perpendicular to the measurement direction, and configured to reflect the positive s-th-order diffracted beams toward the detecting unit; and

a second mirror disposed such that its mirror surface is perpendicular to the measurement direction and faces the first mirror, and configured to reflect the negative s-th-order diffracted beams toward the detecting unit, and

the first mirror and the second mirror are disposed at positions for imaging the positive s-th-order diffracted beams and the negative s-th-order diffracted beams on the detecting unit.

3. The encoder according to claim 1, wherein:

the optical system is configured as a bi-telecentric imaging optical system including two or more lenses.

4. The encoder according to claim 1, wherein:

the optical system includes a diffraction grating for imaging the positive s-th-order diffracted beams and the negative s-th-order diffracted beams on the detecting unit.

5. The encoder according to claim 1, wherein:

the plurality of pattern areas is disposed such that a plurality of joint lines occurs due to an offset of one or both of two neighboring pattern areas.

6. The encoder according to claim 5, wherein:

the joint lines are disposed in a random manner or a pseudo-random manner.

7. The encoder according to claim 6, wherein:

the joint lines are disposed based on an M-sequence code.

8. The encoder according to claim 1, wherein each of the first and second patterns include a plurality of pattern elements that are sequentially positioned in the measurement direction with the offset being provided between the first and second patterns.

9. The encoder according to claim 1, wherein the offset is equal to [g/(2 ×

s)] where g is the predetermined pitch.

10. The encoder according to claim 1, wherein, in the light intensity distribution, the interference fringes have a pitch of [g/(2 ×

s)].

11. The encoder according to claim 1, wherein interference fringes caused by the first pattern area are offset from interference fringes caused by the second pattern area.

12. The encoder according to claim 11, wherein the offset between the interference fringes caused by the first pattern area and the interference fringes caused by the second pattern area is the same as the pitch of the interference fringes.

13. The encoder according to claim 11, wherein the interference fringes caused by the first pattern area and the interference fringes caused by the second pattern area have a same phase.