Methods for in situ monitoring and control of defect formation or healing
First Claim
1. A method for monitoring defect formation or healing, comprising:
- exposing a surface of a material to incident radiation, the material being a two-dimensional material including a graphene or graphene-based film;
detecting scattered, emitted and/or transmitted radiation from at least a portion of the material exposed to the incident radiation; and
generating data indicative of defect formation or healing, wherein the method is performed in situ where the defect formation or healing occurs and the data indicative of defect formation or healing provide a rate of defect formation or healing, a temporal change in the rate of defect formation or healing, a temporal change in the size of the defects, a spatial change in the rate of defect formation or healing, a spatial change in the size of the defects, or combinations thereof.
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Accused Products
Abstract
Production of perforated two-dimensional materials with holes of a desired size range, a narrow size distribution, and a high and uniform density remains a challenge, at least partially, due to physical and chemical inconsistencies from sheet-to-sheet of the two-dimensional material and surface contamination. This disclosure describes methods for monitoring and adjusting perforation or healing conditions in real-time to address inter- and intra-sheet variability. In situ or substantially simultaneous feedback on defect production or healing may be provided either locally or globally on a graphene or other two-dimensional sheet. The feedback data can be used to adjust perforation or healing parameters, such as the total dose or efficacy of the perforating radiation, to achieve the desired defect state.
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Citations
38 Claims
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1. A method for monitoring defect formation or healing, comprising:
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exposing a surface of a material to incident radiation, the material being a two-dimensional material including a graphene or graphene-based film; detecting scattered, emitted and/or transmitted radiation from at least a portion of the material exposed to the incident radiation; and generating data indicative of defect formation or healing, wherein the method is performed in situ where the defect formation or healing occurs and the data indicative of defect formation or healing provide a rate of defect formation or healing, a temporal change in the rate of defect formation or healing, a temporal change in the size of the defects, a spatial change in the rate of defect formation or healing, a spatial change in the size of the defects, or combinations thereof. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38)
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15. A method for monitoring defect formation or healing, comprising:
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exposing a surface of a material to incident radiation, the material being a two-dimensional material including a graphene or graphene-based film; detecting movement of an analyte through defects in the material; and generating data indicative of defect formation or healing, wherein the method is performed in situ where the defect formation or healing occurs and the data indicative of defect formation or healing provide a rate of defect formation or healing, a temporal change in the rate of defect formation or healing, a temporal change in the size of the defects, a spatial change in the rate of defect formation or healing, a spatial change in the size of the defects, a maximum size of the defects, or combinations thereof. - View Dependent Claims (16, 17, 18, 19)
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20. A method for monitoring defect formation or healing, comprising:
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exposing a surface of a material to incident radiation; applying an electrical bias to the material, the material being a two-dimensional material including a graphene or graphene-based film; measuring electrical conductivity through a conductive probe in electrical contact with the material; and generating data indicative of defect formation or healing, wherein the method is performed in situ where the defect formation or healing occurs and the data indicative of defect formation or healing provide a rate of defect formation or healing, a temporal change in the rate of defect formation or healing, a temporal change in the size of the defects, a spatial change in the rate of defect formation or healing, a spatial change in the size of the defects, or combinations thereof.
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21. A method for monitoring defect formation or healing, comprising:
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exposing a surface of a material to incident radiation, the material being a two-dimensional material including a graphene or graphene-based film; heating the material; subsequently measuring temperature of the surface of the material; and generating data indicative of defect formation or healing, wherein the method is performed in situ where the defect formation or healing occurs and the data indicative of defect formation or healing provide a rate of defect formation or healing, a temporal change in the rate of defect formation or healing, a temporal change in the size of the defects, a spatial change in the rate of defect formation or healing, a spatial change in the size of the defects, or combinations thereof.
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Specification