Dual wavelength resampling system and method

• US 10,206,567 B2
• Filed: 07/12/2017
• Issued: 02/19/2019
• Est. Priority Date: 07/12/2017
• Status: Active Grant

• Current Assignee: Santec Holdings Corp.
• Original Assignee: Santec Incorporated
• Inventors: Chong, Changho
• Primary Examiner(s): Hasan, Mohammed A
• Application Number:
  US15/648,239
• Publication Number:
  US 20190014983A1
• Time in Patent Office: 587 Days
• Field of Search: 351206
• CPC Class Codes: A61B 3/102 for optical coherence tomography [OCT]
• CPC Class Codes: G01B 9/02007 Two or more frequencies or sources used for interferometric measurement using only beat G01B9/02003
• CPC Class Codes: G01B 9/02008 by using a frequency comb
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence

Abstract

An optical coherence tomography (OCT) system combining multiple wavelengths is generally described. In an example, the OCT system includes multiple wavelength swept light sources. The system further includes an interferometer into which light from the light sources is directed and a detector configured to produce an imaging sample signal based on light received from the interferometer. The system also includes a splitter configured to split light from at least one of light sources before the light reaches the interferometer. The system also includes a wavelength reference filter having an equal interval frequency comb and a signal processing circuit. The wavelength reference filter is configured to produce a sequential clock waveform from light received from the splitter, and the signal processing circuit is configured to resample the imaging sample signal based on the sequential clock waveform.

Claims

1. An optical coherence tomography (OCT) system comprising:

a first light source configured to emit a first beam having a first wavelength;

a second light source configured to emit a second beam having a second wavelength;

an interferometer, wherein the first beam and the second beam are configured to be directed into the interferometer, and further wherein the interferometer comprises;

a reference path, and

an interferometer sample path;

a detector configured to compare light from the reference path with light from the interferometer sample path and produce an imaging sample signal based on the comparison; and

a first splitter configured to split light from at least one of the first light source and the second light source, wherein the first splitter is located on a light path between the first light source and the interferometer;

a first wavelength reference filter having an equal interval frequency comb, wherein the wavelength reference filter is configured to produce a sequential clock waveform from light received from the first splitter; and

a signal processing circuit configured to resample the imaging sample signal based on the sequential clock waveform.

2. The OCT system of claim 1, wherein the first splitter is configured to split light from the first light source, the OCT system further comprising a second splitter configured to split light from the second light source, wherein the second splitter is located between the second light source and the interferometer.

3. The OCT system of claim 2, further comprising a second wavelength reference filter having a second equal interval frequency comb, wherein the second wavelength reference filter is configured to produce a second sequential clock waveform from light received from the second splitter.

4. The OCT system of claim 3, wherein the first wavelength reference filter has a different interval frequency than the second wavelength reference filter.

5. The OCT system of claim 3, further comprising a combiner configured to combine light received from the first wavelength reference filter with light received from the second wavelength reference filter.

6. The OCT system of claim 5, wherein the combiner comprises at least one of a coupler or a dichroic wavelength division multiplexing (WDM) filter.

7. The OCT system of claim 6, wherein the combiner is configured to generate sequential clock waveforms that correspond to alternatively swept wavelength ranges from the first and the second light sources.

8. The OCT system of claim 7, further comprising a photodiode configured to convert the sequential clock waveform from the combiner to an electrical signal and to pass the electrical signal to the signal processing circuit.

9. The OCT system of claim 6, wherein the signal processing circuit is configured to analyze the image sample signal alternately for different time slots based on a trigger signal from a driver circuit and the sequential clock waveform.

10. The OCT system of claim 9, wherein the signal processing circuit is further configured to create two images by selecting specific time slots of the imaging sample signal based on the sequential waveform.

11. The OCT system of claim 1, wherein the first splitter is configured to pass a majority of the light from the first light source to the interferometer and to pass a minority of the light from the first light source to the first wavelength reference filter.

12. The OCT system of claim 1, further comprising a combiner positioned between the first and second light sources and the first splitter, wherein the combiner is configured to combine light from the first and second light sources.

13. The OCT system of claim 1, further comprising a driver circuit connected to the first light source, the second light source, and the signal processing circuit.

14. The OCT system of claim 13, wherein the signal processing circuit is configured to analyze the imaging sample signal alternately for different time slots based on a trigger signal from the driver circuit and sequential clock waveforms generated at least in part from the first wavelength reference filter.

15. The OCT system of claim 1, wherein the signal processing circuit comprises a field-programmable gate array (FPGA).

16. A method comprising:

emitting, from a first light source, a first beam having a first wavelength;

emitting, from a second light source, a second beam having a second wavelength;

splitting the first beam and the second beam;

passing a first portion of a split beam to an interferometer;

generating, using the interferometer, an image sample form the first portion of the split beam;

passing a second portion of the split beam to a wavelength reference filter;

generating a sequential clock waveform from the second portion of the split beam; and

resampling the image sample using the sequential clock waveform.

17. The method of claim 16, wherein generating a sequential clock waveform comprises generating sequential clock waveforms from split portions of both the first and second beams.

18. The method of claim 17, wherein resampling the image sample is performed using the sequential waveforms from the split portions of both the first and second beams.

19. The method of claim 16, wherein the resampling comprises analyzing the image sample alternately for different time slots based on a trigger signal from a driver circuit and the sequential clock waveform.

20. The method of claim 16, further comprising creating two images by selecting specific time slots of the imaging sample based on the sequential clock waveform.