×

Z-axis microelectromechanical detection structure with reduced drifts

  • US 10,209,269 B2
  • Filed: 09/18/2015
  • Issued: 02/19/2019
  • Est. Priority Date: 12/11/2014
  • Status: Active Grant
First Claim
Patent Images

1. A microelectromechanical detection structure comprising:

  • a substrate having a top surface extending in a plane and a central region;

    a central anchorage element fixed with respect to said substrate and arranged in the central region;

    a detection-electrode arrangement of fixed electrodes;

    an inertial mass suspended above said substrate and at least partially facing said detection-electrode arrangement, the inertial mass capacitively coupled to said detection-electrode arrangement;

    elastic elements coupling the inertial mass to the central anchorage element and configured to support said inertial mass so that the inertial mass is free to rotate about an axis of rotation as a function of a quantity to be detected along a vertical axis that is transverse to said plane, the central anchorage element being arranged at said axis of rotation;

    a first anchorage element coupled to the substrate in the central region;

    a suspension structure coupled to the first anchorage element and suspended over the substrate; and

    a second anchorage element coupled to the suspension structure and to the detection-electrode arrangement without being directly coupled to the substrate, the second anchorage element being positioned above the detection-electrode arrangement and below the suspension structure, the second anchorage element and the suspension structure being configured to support the detection-electrode arrangement in a position that is suspended above the substrate and below the inertial mass.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×