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Tool to provide integrated circuit masks with accurate dimensional compensation of patterns

  • US 10,210,295 B2
  • Filed: 01/30/2017
  • Issued: 02/19/2019
  • Est. Priority Date: 11/25/2015
  • Status: Active Grant
First Claim
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1. A tool to process data representing input integrated circuit patterns of a semiconductor fabrication mask to be used in projection lithography, comprising:

  • a frame generation module configured to partition each region of a starting mask that is organized into separated regions of mask content into overlapped frames of mask data;

    a coherent system engine comprised of an optimal coherent systems (OCS) engine having an input to receive the overlapped frames of mask data of the starting mask and an output to provide a full Transmission Cross Coefficient (TCC); and

    an incoherent system engine having an input connected to the output of the OCS engine and an output that provides a final mask definition for use during fabrication of an integrated circuit, where a loxicoherent system is comprised of a pair of the OCS engine and the incoherent system engine, where the incoherent system engine is configured to;

    form a residual TCC by removing certain coherent system kernels from the full TCC;

    match the residual TCC with a sum of multiplied lower-dimensioned kernels that are separated along axes that are rotated in a doubled domain between mask content axes in the doubled domain;

    decompose at least one low-dimensioned kernel lying within the doubled-domain in the mean-frequency direction into a product of coherent system apertures serving to filter the mask content;

    select as an intensity kernel at least one low-dimensioned kernel lying along the doubled domain axis in a difference-frequency direction; and

    adjust mask fragments by iterating operations across one or more processors.

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