Method and apparatus for monitoring and enhancing on-chip microprocessor reliability
First Claim
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1. A system for projecting reliability to manage system functions, comprising:
- an activity module which determines activity in the system that occurs during operation of the system;
a reliability module interacting with the activity module to determine a reliability measurement for regions for a current period within the system in real-time based upon the activity and measured operational quantities of the system, wherein the reliability measurement characterizes one or more potential physical failure mechanisms; and
a management module comprising a processor comparing the reliability measurement within the system to a locally stored reliability target and increase activity of the system during operation of the system based on whether the reliability measurement is determined to be above or below the stored reliability target;
wherein increasing the activity of the system includes one of increasing a clock rate, reallocating resources, and increasing current or voltage.
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Abstract
A system and method for projecting reliability to manage system functions includes an activity module which determines activity in the system. A reliability module interacts with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system. A management module manages actions of the system based upon the reliability measurement input from the reliability module. This may be to provide corrective action, to reallocate resources, or increase reliability of the module.
29 Citations
17 Claims
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1. A system for projecting reliability to manage system functions, comprising:
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an activity module which determines activity in the system that occurs during operation of the system; a reliability module interacting with the activity module to determine a reliability measurement for regions for a current period within the system in real-time based upon the activity and measured operational quantities of the system, wherein the reliability measurement characterizes one or more potential physical failure mechanisms; and a management module comprising a processor comparing the reliability measurement within the system to a locally stored reliability target and increase activity of the system during operation of the system based on whether the reliability measurement is determined to be above or below the stored reliability target; wherein increasing the activity of the system includes one of increasing a clock rate, reallocating resources, and increasing current or voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. An integrated circuit having a reliability management system integrated therein, comprising:
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an activity module which determines activity within regions of the integrated circuit that occurs during operation of the integrated circuit; a reliability module interacting with the activity module to determine a reliability measurement for the regions for a current period within the system for the circuit in real-time based upon the activity and measured operational quantities of the integrated circuit, wherein the reliability measurement characterizes one or more potential physical failure mechanisms; and a management module comprising a processor comparing the reliability measurement within the system to a locally stored reliability target and increase activity of the integrated system during operation of the integrated circuit based on whether the reliability measurement is determined to be above or below the stored reliability target; wherein increasing the activity of the system includes one of increasing a clock rate, reallocating resources, and increasing current or voltage. - View Dependent Claims (15, 16, 17)
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Specification