Storage device, semiconductor device, electronic device, and server system

• US 10,223,194 B2
• Filed: 10/16/2017
• Issued: 03/05/2019
• Est. Priority Date: 11/04/2016
• Status: Active Grant

• Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Original Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Inventors: Aoki, Takeshi, Kurokawa, Yoshiyuki
• Primary Examiner(s): Nguyen, Hien
• Application Number:
  US15/784,669
• Publication Number:
  US 20180129556A1
• Time in Patent Office: 505 Days
• CPC Class Codes: G06F 11/1004 to protect a block of data words, e.g. CRC or checksum G06F11/1076 takes precedence; security arrangements for protecting computers or computer systems against unauthorized activity G06F21/00

Abstract

Data corrupted by a soft error is recovered. A storage device includes a first memory cell, a second memory cell, a sense circuit electrically connected to the first memory cell through a first sense line and to the second memory cell through a second sense line, a digital-analog converter circuit electrically connected to the first memory cell and the second memory cell through a bit line, and an analog-digital converter circuit. The digital-analog converter circuit has a function of applying voltages as first signals to the first memory cell and the second memory cell. Even when a soft error occurs in the first memory cell or the second memory cell, the storage device has a function of recovering data corrupted by the soft error because the sense circuit selects and outputs a higher one of the voltages applied to the first memory cell and the second memory cell.

Claims

1. A storage device comprising:

a first memory cell and a second memory cell;

a digital-analog converter circuit electrically connected to the first memory cell and the second memory cell through a bit line;

a sense circuit electrically connected to the first memory cell through a first sense line and to the second memory cell through a second sense line; and

an analog-digital converter circuit,

wherein the digital-analog converter circuit is configured to apply voltages as first signals to the first memory cell and the second memory cell,

wherein the sense circuit is configured to select as a second signal a higher one of the voltages applied to the first memory cell and the second memory cell, and

wherein the analog-digital converter circuit is configured to convert the second signal into a digital signal.

2. The storage device according to claim 1, wherein each of the first memory cell and the second memory cell is configured to retain a multilevel data voltage.

3. The storage device according to claim 1,

wherein each of the first memory cell and the second memory cell comprises a transistor comprising a semiconductor layer, and

wherein the semiconductor layers of the transistors of the first memory cell and the second memory cell comprise a metal oxide.

4. The storage device according to claim 1, wherein each of the first memory cell and the second memory cell comprises a transistor comprising a back gate.

5. The storage device according to claim 1,

wherein each of the first memory cell and the second memory cell comprises a transistor comprising a semiconductor layer, and

wherein the semiconductor layers of the transistors of the first memory cell and the second memory cell are provided over a same insulating layer.

6. The storage device according to claim 1,

wherein each of the first memory cell and the second memory cell comprises:

a first transistor, a gate of the first transistor electrically connected to a word line, and one of a source and a drain of the first transistor electrically connected to the bit line;

a second transistor, one of a source and a drain of the second transistor electrically connected to the bit line; and

a capacitor, one electrode of the capacitor electrically connected to the other of the source and the drain of the first transistor and a gate of the second transistor,

wherein the other of the source and the drain of the second transistor of the first memory cell is electrically connected to the first sense line, and

wherein the other of the source and the drain of the second transistor of the second memory cell is electrically connected to the second sense line.

7. The storage device according to claim 1,

wherein the sense circuit comprises a third transistor, a fourth transistor, a fifth transistor, a first capacitor, a second capacitor, and a third capacitor,

wherein a gate of the third transistor is electrically connected to the first sense line through the first capacitor,

wherein a gate of the fourth transistor is electrically connected to the second sense line through the second capacitor,

wherein one of a source and a drain of the third transistor and one of a source and a drain of the fourth transistor are electrically connected to a first power supply line,

wherein the other of the source and the drain of the third transistor, the other of the source and the drain of the fourth transistor, one of a source and a drain of the fifth transistor, and one electrode of the third capacitor are electrically connected to an input terminal of the analog-digital converter circuit and a floating node, and

wherein the other of the source and the drain of the fifth transistor and the other electrode of the third capacitor are electrically connected to a second power supply line.

8. A semiconductor device comprising:

the storage device according to claim 1; and

a processor.

9. An electronic device comprising:

the semiconductor device according to claim 8; and

a display device and a communication module.

10. A server system comprising:

the semiconductor device according to claim 8; and

a communication module.

11. A storage device comprising:

a first memory cell and a second memory cell;

a digital-analog converter circuit electrically connected to the first memory cell and the second memory cell through a bit line;

a sense circuit electrically connected to the first memory cell through a first sense line and to the second memory cell through a second sense line; and

an analog-digital converter circuit,

wherein the digital-analog converter circuit is configured to apply voltages as first signals to the first memory cell and the second memory cell,

wherein the sense circuit is configured to select as a second signal a higher one of the voltages applied to the first memory cell and the second memory cell,

wherein the analog-digital converter circuit is configured to convert the second signal into a digital signal,

wherein each of the first memory cell and the second memory cell comprises a transistor comprising a semiconductor layer, and

wherein the transistor of the second memory cell is provided over the transistor of the first memory cell with an insulating layer therebetween.

12. The storage device according to claim 11, wherein each of the first memory cell and the second memory cell is configured to retain a multilevel data voltage.

13. The storage device according to claim 11, wherein the semiconductor layers of the transistors of the first memory cell and the second memory cell comprise a metal oxide.

14. The storage device according to claim 11, wherein the semiconductor layers of the transistors of the first memory cell and the second memory cell overlap with each other.

15. A storage device comprising:

a first memory cell and a second memory cell;

a digital-analog converter circuit electrically connected to the first memory cell and the second memory cell through a bit line;

a sense circuit electrically connected to the first memory cell through a first sense line and to the second memory cell through a second sense line; and

an analog-digital converter circuit,

wherein the digital-analog converter circuit is configured to apply voltages as first signals to the first memory cell and the second memory cell,

wherein the sense circuit is configured to select as a second signal a higher one of the voltages applied to the first memory cell and the second memory cell,

wherein the analog-digital converter circuit is configured to convert the second signal into a digital signal,

wherein each of the first memory cell, the second memory cell, and the sense circuit comprises a transistor,

wherein the transistor of the first memory cell is provided over the transistor of the sense circuit with a first insulating layer therebetween, and

wherein the transistor of the second memory cell is provided over the transistor of the first memory cell with a second insulating layer therebetween.

16. The storage device according to claim 15, wherein each of the first memory cell and the second memory cell is configured to retain a multilevel data voltage.

17. The storage device according to claim 15, wherein each of the transistors of the first memory cell and the second memory cell comprises a semiconductor layer comprising a metal oxide.

18. The storage device according to claim 15,

wherein each of the transistors of the first memory cell and the second memory cell comprises a semiconductor layer, and

wherein the semiconductor layers of the transistors of the first memory cell and the second memory cell overlap with each other.

19. The storage device according to claim 15, wherein a channel formation region of the transistor of the sense circuit is provided in a silicon wafer.