Semiconductor device using a parallel bit operation and method of operating the same
First Claim
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1. A memory device comprising:
- a memory cell array comprising a plurality of memory cells; and
an internal operation circuit configured to perform both a test operation and an internal operation using a parallel bit operation of simultaneously comparing a plurality of bits,wherein the internal operation circuit is configured to perform the test operation in a test mode of the memory device and the internal operation in an internal operation mode other than the test mode of the memory device based on a command signal received from an outside of the memory device, andwherein the internal operation circuit comprises;
a mode selector configured to provide comparison data received from a host to a parallel bit comparator,wherein the parallel bit comparator is configured to compare read data from the memory cell array with the comparison data to find second data corresponding to the comparison data, and to compare an address of valid data indicated by the second data with an address of the second data to output a result of the comparison to a result generator, andwherein the result generator is configured to output the comparison result obtained by the parallel hit comparator.
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Abstract
A memory device may include a memory cell array including a plurality of memory cells, and an internal operation circuit configured to perform a test operation in a test mode using a parallel bit operation of simultaneously comparing a plurality of bits and also perform an internal operation including a comparison operation with respect to external data in a normal mode other than the test mode using the parallel bit operation.
18 Citations
17 Claims
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1. A memory device comprising:
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a memory cell array comprising a plurality of memory cells; and an internal operation circuit configured to perform both a test operation and an internal operation using a parallel bit operation of simultaneously comparing a plurality of bits, wherein the internal operation circuit is configured to perform the test operation in a test mode of the memory device and the internal operation in an internal operation mode other than the test mode of the memory device based on a command signal received from an outside of the memory device, and wherein the internal operation circuit comprises; a mode selector configured to provide comparison data received from a host to a parallel bit comparator, wherein the parallel bit comparator is configured to compare read data from the memory cell array with the comparison data to find second data corresponding to the comparison data, and to compare an address of valid data indicated by the second data with an address of the second data to output a result of the comparison to a result generator, and wherein the result generator is configured to output the comparison result obtained by the parallel hit comparator. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A semiconductor device comprising:
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an internal operation circuit configured to perform a test operation in a test mode using a parallel bit operation of simultaneously comparing a plurality of bits, and to perform an internal operation comprising a comparison operation with respect to external data in a normal mode other than the test mode by using the parallel bit operation, wherein the internal operation circuit comprises; a mode selector configured to set a mode of the internal operation circuit as the test mode or an internal operation mode of the normal mode; a parallel bit comparator configured to perform a parallel bit comparison (PBC) between data read out from a memory cell array and the external data received from an outside of the semiconductor device by using the parallel bit operation; and a result generator configured to output a comparison result obtained by the parallel bit comparator, wherein, in the internal operation, the internal operation circuit is configured to find the external data from the memory cell array by using the parallel bit operation, and wherein; the semiconductor device is configured to read data from a memory cell array within or outside the semiconductor device, and the internal operation circuit is configured to perform, as the internal operation, at least one of; a search operation of comparing the data read out from the memory cell array with comparison data received from a memory controller to find first data identical to the comparison data and outputting a hit signal to a host when the first data is found; a copy operation of receiving a first target address from the memory controller and copying the first data to memory cells of the memory cell array corresponding to the first target address; a move operation of receiving a second target address from the memory controller and moving the first data to memory cells of the memory cell array corresponding to the second target address; and a swap operation of receiving a third target address from the memory controller and swapping the first data with second data stored in memory cells of the memory cell array corresponding to the third target address.
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14. A memory device comprising:
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a memory cell array comprising a plurality of memory cells; and an internal operation circuit including a parallel bit comparator configured to simultaneously compare first data from a first set of memory cells of the memory cell array with second data received from outside the memory device in an internal operation mode of the memory device, wherein the parallel bit comparator is configured to operate in a test mode of the memory device for a parallel bit operation, wherein, in the internal operation mode, the internal operation circuit is configured to find the second data from the memory cell array by using the parallel bit operation, wherein the internal operation circuit is configured to perform at least one of; a rewrite operation of rewriting the second data in the first set of memory cells of the memory cell array corresponding to a first address, a copy operation of copying the first data to a second set of memory cells of the memory cell array corresponding to a second address, a move operation of moving the first data to a third set of memory cells of the memory cell array corresponding to a third address, and a swap operation of swapping the first data with a third data stored in a fourth set of memory cells of the memory cell array corresponding to a fourth address. - View Dependent Claims (15, 16, 17)
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Specification