Pixel isolation elements, devices and associated methods
DCFirst Claim
1. An imager device, comprising:
- at least two adjacent light sensitive image sensor pixels each having a light incident surface, and a backside surface opposite the light incident surface;
a peripheral isolation element at least partially separating said two adjacent light sensitive pixels;
each of said pixels having at least one doped region disposed on at least one of the light incident surface and the backside surface,wherein the peripheral isolation element comprises at least two materials having different indices of refraction,wherein said peripheral isolation element comprises a first, a second and a third layer, wherein said third layer is disposed between said first and second layers, and wherein each of said first and second layer exhibits an index of refraction less than an index of refraction of said third layer.
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Abstract
Light trapping pixels, devices incorporating such pixels, and various associated methods are provided. In one aspect, for example, a light trapping pixel device can include a light sensitive pixel having a light incident surface, a backside surface opposite the light incident surface, and a peripheral sidewall disposed into at least a portion of the pixel and extending at least substantially around the pixel periphery. The pixel can also include a backside light trapping material substantially covering the backside surface and a peripheral light trapping material substantially covering the peripheral sidewall. The light contacting the backside light trapping material or the peripheral light trapping material is thus reflected back toward the pixel.
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Citations
83 Claims
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1. An imager device, comprising:
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at least two adjacent light sensitive image sensor pixels each having a light incident surface, and a backside surface opposite the light incident surface; a peripheral isolation element at least partially separating said two adjacent light sensitive pixels; each of said pixels having at least one doped region disposed on at least one of the light incident surface and the backside surface, wherein the peripheral isolation element comprises at least two materials having different indices of refraction, wherein said peripheral isolation element comprises a first, a second and a third layer, wherein said third layer is disposed between said first and second layers, and wherein each of said first and second layer exhibits an index of refraction less than an index of refraction of said third layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 27, 28, 29, 30, 31, 32, 33, 38, 39, 40, 41, 42, 43, 44, 52, 53, 54, 55, 56, 57, 64, 65, 66, 67, 68, 69, 76, 77, 80, 81)
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18. An imager device, comprising:
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at least two adjacent light sensitive image sensor pixels each having a light incident surface, and a backside surface opposite the light incident surface; a peripheral isolation element separating said at least two adjacent light sensitive pixels so as to reduce optical crosstalk therebetween, said isolation element comprising at least two materials having different indices of refraction, at least one doped region disposed on at least one of the light incident surface and the backside surface, wherein said peripheral isolation element comprises a first, a second and a third layer, wherein said third layer is disposed between said first and second layers, and wherein each of said first and second layers exhibits an index of refraction less than an index of refraction of said third layer. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26, 34, 35, 36, 37, 45, 46, 47, 48, 49, 50, 51, 58, 59, 60, 61, 62, 63, 70, 71, 72, 73, 74, 75, 78, 79, 82, 83)
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Specification