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Methods and systems for centering of pins during instance abutment

  • US 10,235,490 B1
  • Filed: 05/08/2017
  • Issued: 03/19/2019
  • Est. Priority Date: 05/08/2017
  • Status: Active Grant
First Claim
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1. A computer implemented method for abutting circuit devices in an integrated circuit design, the method comprising:

  • receiving, by a computer, a plurality of database records of a plurality of circuit devices forming an integrated circuit (IC), wherein a first circuit device of the plurality of circuit devices includes a first set of pin figures and a second circuit device of the plurality of circuit devices includes a second set of pin figures;

    determining, by the computer, that a first pin figure of the first set of pin figures is to be overlapped with a second pin figure of the second set of pin figures based upon the location data of the first circuit device and the second circuit device in the respective database records;

    identifying, by the computer, a first center location of the first pin figure and a second center location of the second pin figure based on the location data of the first circuit device and the second circuit device in the respective database records;

    positioning, by the computer, at least one of the first circuit and second circuit devices such that the first center location and the second center location overlap;

    generating, by the computer, a third circuit device formed by abutting first and second circuit devices and having a portion formed by merging and optimizing the overlapping first and second pin figures; and

    updating, by the computer, the respective database records of the first and second circuit devices based on the generating of the third circuit device formed by abutting first and second circuit devices, whereby the computer provides a computationally efficient and a flexible centering of the first and second pin figures.

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