Semiconductor device, method of manufacturing the same and generation method of unique information
First Claim
1. A method of manufacturing a semiconductor device having a function of generating unique information based on an output of a circuit component of a second circuit, the method comprising:
- manufacturing a first circuit and the second circuit;
manufacturing the first circuit in accordance with a first manufacturing condition; and
manufacturing the second circuit in accordance with a second manufacturing condition;
when the second manufacturing condition is compared with the first manufacturing condition, the second manufacturing condition further includes a factor which increases a variation of the circuit component;
wherein the first manufacturing condition comprises setting a diffusion region of a first transistor having a channel length less than a constant value as an LDD structure and performing a channel-ion implantation by forming a first dopant concentration on a surface of a substrate;
wherein the second manufacturing condition comprises not setting a diffusion region of a second transistor having a channel length less than the constant value as the LDD structure and performing the channel-ion implantation by forming the first dopant concentration at a first position that is deeper than the surface of the substrate.
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Accused Products
Abstract
A semiconductor device with improved generation function of unique information is provided. The semiconductor device includes an integrated circuit designed or fabricated based on a general design condition or manufacturing condition, an input/output circuit, and a unique-information generation circuit to generate unique information of the semiconductor device. The unique-information generation circuit includes a circuit for PUF and a code-generation unit. The circuit for PUF is fabricated based on the design condition or manufacturing condition which is different from the general design condition or manufacturing condition and has a factor which makes variations of circuit components become large. The code-generation unit generates codes based on the output of the circuit for PUF.
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Citations
12 Claims
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1. A method of manufacturing a semiconductor device having a function of generating unique information based on an output of a circuit component of a second circuit, the method comprising:
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manufacturing a first circuit and the second circuit; manufacturing the first circuit in accordance with a first manufacturing condition; and manufacturing the second circuit in accordance with a second manufacturing condition; when the second manufacturing condition is compared with the first manufacturing condition, the second manufacturing condition further includes a factor which increases a variation of the circuit component; wherein the first manufacturing condition comprises setting a diffusion region of a first transistor having a channel length less than a constant value as an LDD structure and performing a channel-ion implantation by forming a first dopant concentration on a surface of a substrate; wherein the second manufacturing condition comprises not setting a diffusion region of a second transistor having a channel length less than the constant value as the LDD structure and performing the channel-ion implantation by forming the first dopant concentration at a first position that is deeper than the surface of the substrate. - View Dependent Claims (2, 3, 4, 5)
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6. A method of generating unique information of a semiconductor device, comprising:
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manufacturing a first circuit in accordance with a first manufacturing condition; manufacturing a second circuit in accordance with a second manufacturing condition, wherein when the second manufacturing condition is compared with the first manufacturing condition, the second manufacturing condition further includes a factor which increases a variation of a circuit component; and generating the unique information based on an output of the circuit component of the second circuit; wherein the first manufacturing condition comprises setting a diffusion region of a first transistor having a channel length less than a constant value as an LDD structure and performing a channel-ion implantation by forming a first dopant concentration on a surface of a substrate; the second manufacturing condition comprises not setting a diffusion region of a second transistor having a channel length less than the constant value as the LDD structure and performing the channel-ion implantation by forming the first dopant concentration at a first position that is deeper than the surface of the substrate. - View Dependent Claims (7, 8)
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9. A semiconductor device, comprising:
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a first circuit manufactured in accordance with a first manufacturing condition; a second circuit manufactured in accordance with a second manufacturing condition, wherein when the second manufacturing condition is compared with the first manufacturing condition, the second manufacturing condition further includes a factor which increases a variation of a circuit component; and a generation circuit, generating unique information based on an output of a circuit component of the second circuit; wherein the first manufacturing condition comprises setting a diffusion region of a first transistor having a channel length less than a constant value as an LDD structure and performing a channel-ion implantation by forming a first dopant concentration on a surface of a substrate; the second manufacturing condition comprises not setting a diffusion region of a second transistor having a channel length less than the constant value as the LDD structure and performing the channel-ion implantation by forming the first dopant concentration at a first position that is deeper than the surface of the substrate. - View Dependent Claims (10, 11, 12)
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Specification