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Systems and methods for wireless device testing

  • US 10,247,773 B2
  • Filed: 07/01/2016
  • Issued: 04/02/2019
  • Est. Priority Date: 07/01/2016
  • Status: Active Grant
First Claim
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1. A device, comprising:

  • a memory that stores computer-executable instructions;

    a logic circuit;

    a test block comprising one or more scan blocks and a test module configured to test at least one of the logic circuit or the memory of the device;

    a wireless connectivity module configured to wirelessly communicate with a tester device, the wireless connectivity module comprising a first communication circuitry and a second communication circuitry, the second communication circuitry comprising a high bandwidth wireless communication connection; and

    at least one processor of one or more processors configured to access the memory, wherein the at least one processor of the one or more processors is configured to execute the computer-executable instructions to;

    determine, using the first communication circuitry of the wireless connectivity module, a first wireless connection between the device and the tester device;

    determine, using the second communication circuitry of the wireless connectivity module, a second wireless connection between the device and the tester device;

    receive, using the first communication circuitry over the first wireless connection, a first signal from the tester device, the first signal comprising first data including a manufacturing test for at least one of the logic circuit or the memory of the device;

    cause to send the first data to the test module of the test block;

    receive, using the second communication circuitry over the second wireless connection, a second signal from the tester device, the second signal comprising second data including a scan pattern for a scan test;

    convert, using a serial to parallel scan converter, the scan pattern to a number of parallel scan inputs;

    cause to send the parallel scan inputs to the one or more scan blocks of the device;

    receive from the test module, third data indicative of a result of the manufacturing test;

    receive from the one or more scan blocks, fourth data indicative of a result of the scan test;

    cause to send, using the wireless connectivity module over the first wireless connection, the third data to the tester device; and

    cause to send, using the wireless connectivity module over the second wireless connection, the fourth data to the tester device.

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