Voltage monitor self testing

• US 10,254,376 B2
• Filed: 04/11/2017
• Issued: 04/09/2019
• Est. Priority Date: 04/11/2017
• Status: Active Grant

• Current Assignee: Hamilton Sundstrand Corporation (Raytheon Technologies Corporation d/b/a RTX)
• Original Assignee: Hamilton Sundstrand Corporation (Raytheon Technologies Corporation d/b/a RTX)
• Inventors: Wilson, Michael A., Reyes, Harold J.
• Primary Examiner(s): Nguyen, Tung X
• Application Number:
  US15/484,869
• Publication Number:
  US 20180292504A1
• Time in Patent Office: 728 Days
• CPC Class Codes: G01R 1/36 Overload-protection arrangements or circuits for electric measuring instruments
• CPC Class Codes: G01R 19/0084 measuring voltage only all subgroups of G01R19/00 take precedence
• CPC Class Codes: G01R 19/1659 to indicate that the value is within or outside a predetermined range of values (window) G01R19/16514, G01R19/16519, G01R19/16528 and G01R19/16533 take precedence
• CPC Class Codes: G01R 35/00 Testing or calibrating of apparatus covered by the other groups of this subclass
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

Abstract

A voltage monitor system includes a voltage rail. A voltage monitor is operatively connected to the voltage rail to monitor voltage of the voltage rail with at least one input connection. A self-test module is operatively connected to the voltage rail to perturb voltage at the at least one input connection of the voltage monitor for testing the voltage monitor.

Claims

1. A voltage monitor system comprising:

a voltage rail;

a voltage monitor operatively connected to the voltage rail to monitor voltage of the voltage rail with at least one input connection;

a self-test module operatively connected to the voltage rail to perturb voltage at the at least one input connection of the voltage monitor for testing the voltage monitor; and

a logic component operatively connected to a voltage input of the self-test module and operatively connected to at least one output of the voltage monitor, wherein the logic component is configured to change voltage of the voltage input of the self-test module and monitor voltage of the at least one output of the voltage monitor to determine test response of the voltage monitor to the change in voltage of the voltage input of the self-test module, wherein the self-test module includes a capacitor connected in series between the voltage rail and the voltage input of the self-test module to perturb voltage at the at least one input connection of the voltage monitor in response to a change in voltage of the voltage input of the self-test module.

2. The system as recited in claim 1, wherein the voltage rail includes a first resistor and a second resistor in series with the first resistor as a voltage divider, wherein the at least one input connection includes an input connection connecting from a node between the first and second resistors and an undervoltage comparator of the voltage monitor.

3. The system as recited in claim 2, wherein the self-test module connects to the voltage rail between the first and second resistors.

4. The system as recited in claim 2, wherein the voltage rail includes a third resistor connected in series with the second resistor, wherein the at least one input connection includes an input connection connecting from a node between the second and third resistors and an overvoltage comparator of the voltage monitor.

5. The system as recited in claim 1, wherein the self-test module includes a capacitor connected to the voltage rail to perturb voltage at the at least one input connection of the voltage monitor in response to a change in voltage in a test voltage input to the capacitor.

6. The system as recited in claim 5, wherein the capacitor is a first capacitor, and further comprising a second capacitor operatively connected to the voltage rail at a common node with where the first capacitor connects to the voltage rail for filtering noise and to prevent over-spike from the first capacitor.

7. The system as recited in claim 1, wherein the voltage rail includes a first resistor and a second resistor in series with the first resistor as a voltage divider, wherein the at least one input connection includes an input connection connecting from a node between the first and second resistors and an undervoltage comparator of the voltage monitor.

8. The system as recited in claim 7, wherein the self-test module connects to the voltage rail between the first and second resistors.

9. The system as recited in claim 7, wherein the voltage rail includes a third resistor connected in series with the second resistor, wherein the at least one input connection includes an input connection connecting from a node between the second and third resistors and an overvoltage comparator of the voltage monitor.

10. The system as recited in claim 9, wherein the at least one output of the voltage monitor includes a voltage output of the undervoltage comparator and a voltage output of the overvoltage comparator.

11. The system as recited in claim 10, wherein the logic component is configured to test for a reaction in the voltage output of the undervoltage comparator in response to a drop in voltage at the voltage input of the self-test module.

12. The system as recited in claim 10, wherein the logic component is configured to test for a reaction in the voltage output of the overvoltage comparator in response to a rise in voltage at the voltage input of the self-test module.

13. The system as recited in claim 1, wherein the capacitor is a first capacitor, and further comprising a second capacitor operatively connected to the voltage rail at a common node with where the first capacitor connects to the voltage rail for filtering noise and to prevent over-spike from the first capacitor.

14. The system as recited in claim 13, wherein the second capacitor is connected to ground.

15. A method of testing a voltage monitor comprising:

supplying a secondary voltage at a node in a voltage divider of a voltage rail;

changing the secondary voltage;

analyzing output from a voltage monitor connected to the voltage rail to determine whether the output from the voltage monitor is within a predetermined range; and

signaling a fault if the output form the voltage monitor is not within the predetermined range, wherein changing the secondary voltage includes at least one of;

spiking the secondary voltage downward to test the output of the voltage monitor for proper monitoring of undervoltage;

or

spiking the secondary voltage upward to test the output of the voltage monitor for proper monitoring of overvoltage.

16. The method as recited in claim 15, further comprising signaling no fault if the output from the voltage monitor is within the predetermined range.