Methods and apparatus for a capacitive pressure sensor
First Claim
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1. A capacitive sensor, comprising:
- a first substrate, having a first surface, comprising a protective material; and
a second substrate, having a first surface adjacent to the first surface of the first substrate, comprising;
a capacitor comprising;
a first electrode; and
a second electrode positioned substantially coplanar with the first electrode;
wherein the first electrode and the second electrode form a capacitance;
wherein;
a gap is disposed between the first and second substrates;
the first substrate deforms under the applied pressure to a second surface of the first substrate and reduces at least a portion of the gap between the first and second substrates; and
the second substrate maintains its shape under the applied pressure.
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Abstract
Various embodiments of the present technology may comprise methods and apparatus for a capacitive pressure sensor configured to detect firm pressure to a sensing surface. The capacitive pressure sensor may comprise a first substrate and a second substrate, wherein at least one of the first and second substrate is configured to deform when firm pressure is applied. The deformation of the sensor may either create a gap between the substrates or eliminate a gap between the substrates. The deformation may be interpreted as firm pressure to the sensing surface.
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Citations
14 Claims
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1. A capacitive sensor, comprising:
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a first substrate, having a first surface, comprising a protective material; and a second substrate, having a first surface adjacent to the first surface of the first substrate, comprising; a capacitor comprising; a first electrode; and a second electrode positioned substantially coplanar with the first electrode; wherein the first electrode and the second electrode form a capacitance; wherein; a gap is disposed between the first and second substrates; the first substrate deforms under the applied pressure to a second surface of the first substrate and reduces at least a portion of the gap between the first and second substrates; and the second substrate maintains its shape under the applied pressure. - View Dependent Claims (2, 3, 4, 5)
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6. A method for detecting an applied pressure, comprising:
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providing a capacitive sensor comprising; a first substrate; and a second substrate; wherein; the second substrate comprises a first electrode coplanar with a second electrode; the first and second electrodes form a capacitance; and the first substrate deforms under the applied pressure to a second surface of the first substrate and reduces at least a portion of a gap between the first and second substrates; and the second substrate maintains its shape under the applied pressure; generating an electric field between the first and second electrodes; measuring a change in the capacitance of the capacitive sensor in response to at least one of; a change in the electric field; and a change in distance between the first and second substrates; utilizing the measured change in the capacitance to determine; a first applied pressure; and a second applied pressure. - View Dependent Claims (7, 8, 9)
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10. A system for detecting proximity, touch, and pressure, comprising:
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a capacitive sensor, comprising; a first substrate having a first surface and comprising a protective material; and a second substrate having a first surface adjacent to the first surface of the first substrate and comprising; a capacitor comprising; a first electrode; and a second electrode positioned substantially coplanar with the first electrode;
wherein the first and second electrodes form a capacitance;wherein; a gap is disposed between the first and second substrates; the first substrate deforms under the applied pressure to a second surface of the first substrate and reduces at least a portion of the gap between the first and second substrates; and the second substrate maintains its shape under the applied pressure; a measurement circuit coupled to the capacitive sensor and configured to; measure a capacitance of the capacitor; and output a digital value according to the measured capacitance; and a logic unit coupled to the measurement circuit and configured to; compare the digital value to; a first threshold; and a second threshold; and output a signal according to the comparison. - View Dependent Claims (11, 12, 13, 14)
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Specification